Application of Si-strip technology to X-ray diffraction instrumentation von Gerndt, E., Dąbrowski, W., Brügemann, L., Fink, J., Świentek, K., Wiącek, P.

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Detectors for X-ray diffraction and scattering: a user's overview von Brügemann, Lutz, Gerndt, Ekkehard K.E.

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Application of Ni/C Göbel Mirrors von Dietsch, Reiner, Brügemann, L., Mai, H., Holz, T.

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X-ray grazing incidence diffraction from polycrystalline Sb films on single-crystal substrates von Findeisen, E, Brugemann, L, Stettner, J, Tolan, M

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High-resolution small-angle x-ray diffraction studies of evaporated silicon and germanium layers von Bloch, R, Brugemann, L, Press, W

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Surface and interface topography of amorphous SiO2/crystalline Si(100) studied by X-ray diffraction von Brugemann, L, Bloch, R, Press, W, Gerlach, P

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MBE grown GaAs on GaAs (001): UHV X-ray diffraction measurements von Bloch, R, Brugemann, L, Press, W, Tolan, M, Behrens, K -M, Olde, J, Skibowski, M

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X-Ray Diffraction from Laterally Structured Surfaces: Total External Reflection and Grating Truncation Rods von Tolan, M, König, G, Brügemann, L, Press, W, Brinkop, F, Kotthaus, J. P

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X-ray-diffraction measurements from imperfect GaAs crystals: Evidence for near-surface defects von Bloch, R, Bahr, D, Olde, J, Brügemann, L, Press, W

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X-ray grazing incidence diffraction from polycrystalline antimony films on single-crystal substrates von Findeisen, E, Brugemann, L, Stettner, J, Tolan, M

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Surface and interface topography of amorphous SiO 2 /crystalline Si(100) studied by X-ray diffraction von Brugemann, L, Bloch, R, Press, W, Gerlach, P

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MBE grown GaAs on GaAs (001) : UHV x-ray diffraction measurememts von BLOCH, R, BRUGEMANN, L, PRESS, W, TOLAN, M, BEHRENS, K.-M, OLDE, U, SKIBOWSKI, M

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Resolution investigations of X-ray three-crystal diffractometers von Brügemann, L., Bloch, R., Press, W., Tolan, M.

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Nanometer‐Multischichtsysteme für die Röntgenanalytik von Dietsch, R., Holz, Th, Leson, A., Mai, H., Bahr, D., Brügemann, L., Lange, J., Hoffmann, A., Pink, F.

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Targeted therapy of underlying conditions improves sinus rhythm maintenance in patients with persistent atrial fibrillation: results of the RACE 3 trial von Rienstra, Michiel, Hobbelt, Anne H, Alings, Marco, Tijssen, Jan G P, Smit, Marcelle D, Brügemann, Johan, Geelhoed, Bastiaan, Tieleman, Robert G, Hillege, Hans L, Tukkie, Raymond, Van Veldhuisen, Dirk J, Crijns, Harry J G M, Van Gelder, Isabelle C

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Nanometer-Multischichtsysteme für die Röntgenanalytik von Dietsch, R., Holz, Th, Leson, A., Mai, H., Bahr, D., Brügemann, L., Lange, J., Hoffmann, A., Pink, F.

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Nanometer-Multischichtsysteme für die RöntgenanalytikMultilayer systems for X-ray analysisi von Dietsch, R., Holz, Th, Leson, A., Mai, H., Bahr, D., Brügemann, L., Lange, J., Hoffmann, A., Pink, F.

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Daily Physical Activity in Stable Heart Failure Patients von Dontje, Manon L, van der Wal, Martje H L, Stolk, Ronald P, Brügemann, Johan, Jaarsma, Tiny, Wijtvliet, Petra E P J, van der Schans, Cees P, de Greef, Mathieu H G

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P2294Four targeted therapies and less than four targeted therapies of underlying conditions against conventional therapy in atrial fibrillation - data from the RACE 3 study von Nguyen, B O, Rienstra, M, Hobbelt, A H, Alings, M, Tijssen, J G P, Smit, M D, Brugemann, J, Geelhoed, B, Tieleman, R G, Hillege, H L, Tukkie, R, Van Veldhuisen, D J, Crijns, H J G M, Van Gelder, I C

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Multilayer x-ray optics for energies E greater than 8 keV and their application in x-ray analysis von Dietsch, R, Braun, S, Holz, T, Mai, H, Scholz, R, Brügemann, L

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