Introduction to Thin Film Transistors: Physics and Technology of TFTs von Brotherton, S. D

Volltext

Polycrystalline silicon thin film transistors von Brotherton, S D

Volltext

Short channel effects in polysilicon thin film transistors von Fortunato, G., Valletta, A., Gaucci, P., Mariucci, L., Brotherton, S.D.

Volltext

Kink effect in short-channel polycrystalline silicon thin-film transistors von Valletta, A., Gaucci, P., Mariucci, L., Fortunato, G., Brotherton, S. D.

Volltext

Numerical simulation of parasitic resistance effects in polycrystalline silicon TFTs von Gaucci, P., Valletta, A., Mariucci, L., Fortunato, G., Brotherton, S.D.

Volltext

Analysis of electrical characteristics of gate overlapped lightly doped drain (GOLDD) polysilicon thin-film transistors with different LDD doping concentration von Bonfiglietti, A., Cuscuna, M., Valletta, A., Mariucci, L., Pecora, A., Fortunato, G., Brotherton, S.D., Ayres, J.R.

Volltext

Influence of melt depth in laser crystallized poly-Si thin film transistors von Brotherton, S. D., McCulloch, D. J., Gowers, J. P., Ayres, J. R., Trainor, M. J.

Volltext

Hot carrier-induced degradation of gate overlapped lightly doped drain (GOLDD) polysilicon TFTs von Valletta, A., Mariucci, L., Fortunato, G., Brotherton, S.D., Ayres, J.R.

Volltext

A new self-consistent model for the analysis of hot-carrier induced degradation in lightly doped drain (LDD) and gate overlapped LDD polysilicon TFTs von Valletta, A., Mariucci, L., Pecora, A., Fortunato, G., Ayres, J.R., Brotherton, S.D.

Volltext

Surface roughness effects in laser crystallized polycrystalline silicon von McCulloch, D. J., Brotherton, S. D.

Volltext

Modeling of laser-annealed polysilicon TFT characteristics von Armstrong, G.A., Uppal, S., Brotherton, S.D., Ayres, J.R.

Volltext

Control and analysis of leakage currents in poly-Si thin-film transistors von Brotherton, S. D., Ayres, J. R., Trainor, M. J.

Volltext

Defect production and lifetime control in electron and γ-irradiated silicon von Brotherton, S. D., Bradley, P.

Volltext

Iron and the iron-boron complex in silicon von BORTHERTON, S. D, BRADLEY, P, GILL, A

Volltext

Electrical characterization of directionally solidified polycrystalline silicon von Bonfiglietti, A., Valletta, A., Gaucci, P., Mariucci, L., Fortunato, G., Brotherton, S. D.

Volltext

Numerical simulation of transient emission from deep level traps in polysilicon thin film transistors von Armstrong, G.A, Ayres, J.R, Brotherton, S.D

Volltext

Dopant and defect interactions in polycrystalline silicon thin-film transistors von Valletta, A., Mariucci, L., Bonfiglietti, A., Fortunato, G., Brotherton, S. D.

Volltext

Poly-crystalline silicon thin film devices for large area electronics von Brotherton, SD

Volltext

Electrical observation of the Au-Fe complex in silicon von BROTHERTON, S. D, BRADLEY, P, GILL, A, WEBER, E. R

Volltext

Annealing kinetics of the gold-iron complex in silicon von BROTHERTON, S. D, BRADLEY, P, GILL, A

Volltext