Transient current technique for charged traps detection in silicon bonded interfaces von Bronuzzi, J., Bouvet, D., Charrier, C., Fournel, F., García, M. F., Mapelli, A., Moll, M., Rouchouze, E., Sallese, J. M.

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Analytical model for Transient Current Technique (TCT) signal prediction and analysis for thin interface characterization von Bronuzzi, J., Mapelli, A., Sallese, J.M.

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Principle of the electrically induced Transient Current Technique von Bronuzzi, J., Moll, M., Bouvet, D., Mapelli, A., Sallese, J.M.

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Principle and modelling of Transient Current Technique for interface traps characterization in monolithic pixel detectors obtained by CMOS-compatible wafer bonding von Bronuzzi, J., Mapelli, A., Moll, M., Sallese, J.M.

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Principle of the electrically induced Transient Current Technique von Bronuzzi, J, Moll, M, Bouvet, D, Mapelli, A, Sallese, JM

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Transient current technique for charged traps detection in silicon bonded interfaces von Bronuzzi, J, Bouvet, D, Charrier, C, Fournel, F, Garcia, M. F, Mapelli, A, Moll, M, Rouchouze, E, Sallese, J. M

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