Emission of electrons from a clean gold surface induced by slow, very highly charged ions at the image charge acceleration limit von AUMAYR, F, KURZ, H, SCHNEIDER, D, BRIERE, M. A, MCDONALD, J. W, CUNNINGHAM, C. E, WINTER, H. P

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Charge State Dependent Energy Loss of Slow Heavy Ions in Solids von Schenkel, T., Briere, M. A., Barnes, A. V., Hamza, A. V., Bethge, K., Schmidt-Böcking, H., Schneider, D. H.

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Équité, diversité et inclusion dans les organisations sportives von Amélie Keyser-Verreault, Sophie Brière, Marilou St-Pierre, Guylaine Demers, Diane Culver

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Electronic Sputtering of Thin Conductors by Neutralization of Slow Highly Charged Ions von Schenkel, T., Briere, M. A., Schmidt-Böcking, H., Bethge, K., Schneider, D. H.

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Investigations of the interactions of highest charge state ions with surfaces von Schneider, D H G, Briere, M A

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Emission of secondary particles from metals and insulators at impact of slow highly charged ions von Schenkel, T., Barnes, A.V., Briere, M.A., Hamza, A., Schach von Wittenau, A., Schneider, D.H.

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AFM studies of a new type of radiation defect on mica surfaces caused by highly charged ion impact von Ruehlicke, C., Briere, M.A., Schneider, D.

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Atomic displacement due to the electrostatic potential energy of very highly charged ions at solid surfaces von Schneider, D., Briere, M.A., Clark, M.W., McDonald, J., Biersack, J., Siekhaus, W.

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Ion/surface interaction studies with 1-3 keV/amu ions up to Th80 von Schneider, D. H., Briere, M. A., McDonald, J., Biersack, J.

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A quantitative investigation of hydrogen in the metal-oxide-silicon system using NRA von Briere, M.A., Braunig, D.

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Energy loss straggling of MeV ions in thin solid films von Briere, M.A., Biersack, J.P.

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Non-equilibrium energy loss for very highly charged ions in insulators von Briere, M A, Schenkel, T, Schneider, D H, Bauer, P, Arnau, A

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Electronic Sputtering and Desorption Effects in TOF-SIMS Studies Using Slow Highly Charged Ions like Au69 von Schmidt-Böcking, H., Schneider, D., Briere, M.A., Schenkel, T., Bethge, Klaus

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Studies of the interaction of slow very highly charged ions with solid surfaces using the LLNL EBIT facility von Briere, M.A., Schneider, D., McDonald, J., Reaves, M., Rühlicke, C., Weinberg, G., Knapp, D.

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Study of hydrogen incorporation in MOS-structures after various process steps using nuclear reaction analysis (NRA) von Krauser, J., Wulf, F., Briere, M.A., Steiger, J., Bräunig, D.

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Observation of defects on insulator surfaces following bombardment with slow Kr 35+, Xe 44+, Th 74+, and U 70+ ions von Schneider, D., Briere, M.A., McDonald, J., Siekhaus, W.

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An improved displacement damage monitor von Barry, A L, MAXSEINER, R, Wojcik, R, Briere, M A, Braeunig, D

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Distinction between multicharged ion species with equal q/m von Aumayr, F., Kurz, H., Winter, HP, Schneider, D., Briere, M. A., McDonald, J. W.

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Measurements of the accumulation of hydrogen at the silicon-silicon-dioxide interface using nuclear reaction analysis von Briere, M.A., Wulf, F., Braunig, D.

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Hydrogen pile-up at interfaces between differently doped layers of amorphous silicon von Neitzert, H.C., Briere, M.A., Lechner, P.

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