InP HBT Thermal Management by Transferring to High Thermal Conductivity Silicon Substrate von Thiam, Arame, Roelens, Yannick, Coinon, Christophe, Avramovic, Vanessa, Grandchamp, Brice, Ducatteau, Damien, Wallart, Xavier, Maneux, Cristell, Zaknoune, Mohammed

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RF Small and large signal characterization of a 3D integrated GaN/RF-SOI SPST switch von Drillet, Frédéric, Loraine, Jérôme, Saleh, Hassan, Lahbib, Imene, Grandchamp, Brice, Iogna-Prat, Lucas, Lahbib, Insaf, Sow, Ousmane, Kumar, Albert, U'Ren, Gregory

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Characterization and Modeling of Graphene Transistor Low-Frequency Noise von Grandchamp, B., Fregonese, S., Majek, C., Hainaut, C., Maneux, C., Meng, N., Happy, H., Zimmer, T.

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Submicrometer InP/InGaAs DHBT Architecture Enhancements Targeting Reliability Improvements von Kone, G. A., Grandchamp, B., Hainaut, C., Marc, F., Labat, N., Zimmer, T., Nodjiadjim, V., Riet, M., Dupuy, J., Godin, J., Maneux, C.

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A W-band RF-MEMS switched LNA in a 70 nm mHEMT process: A W-Band RF-MEMS Switched LNA von Reyaz, Shakila, Gustafsson, Andreas, Samuelsson, Carl, Malmqvist, Robert, Grandchamp, Brice, Rantakari, Pekka, Vähä-Heikkilä, Tauno

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Trends in Submicrometer InP-Based HBT Architecture Targeting Thermal Management von Grandchamp, B., Nodjiadjim, V., Zaknoune, M., Kone, G. A., Hainaut, C., Godin, J., Riet, M., Zimmer, T., Maneux, C.

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A W-band RF-MEMS switched LNA in a 70 nm mHEMT process von Reyaz, Shakila, Gustafsson, Andreas, Samuelsson, Carl, Malmqvist, Robert, Grandchamp, Brice, Rantakari, Pekka, Vähä-Heikkilä, Tauno

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Characterization of self-heating in Si–Ge HBTs with pulse, DC and AC measurements von Sahoo, Amit Kumar, Fregonese, Sébastien, Weiß, Mario, Grandchamp, Brice, Malbert, Nathalie, Zimmer, Thomas

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W-Band RF-Mems Dicke Switch Networks in a Gaas MMIC Process von Reyaz, Shakila Bint, Samuelsson, Carl, Malmqvist, Robert, Seok, Seonho, Fryziel, Michel, Rolland, Paul-Alain, Grandchamp, Brice, Rantakari, Pekka, Vähä-Heikkilä, and Tauno

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BCB Cap Packaging of MEMS Switches Integrated With 100-[Formula Omitted] MMIC Wafer von Seok, Seonho, Kim, Janggil, Fryziel, Michel, Rolland, Nathalie, Grandchamp, Brice, Simon, Winfried, Baggen, Rens

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Preliminary results of storage accelerated aging test on InP/InGaAs DHBT von Koné, G.A., Grandchamp, B., Hainaut, C., Marc, F., Maneux, C., Labat, N., Zimmer, T., Nodjiadjim, V., Godin, J.

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BCB Cap Packaging of MEMS Switches Integrated With 100- \mu MMIC Wafer von Seonho Seok, Janggil Kim, Fryziel, Michel, Rolland, Nathalie, Grandchamp, Brice, Simon, Winfried, Baggen, Rens

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Thermal aging model of InP/InGaAs/InP DHBT von Ghosh, S., Marc, F., Maneux, C., Grandchamp, B., Koné, G.A., Zimmer, T.

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A GaAs MMIC Single-Chip RF-MEMS Switched Tunable LNA von Malmqvist, Robert, Samuelsson, Carl, Reyaz, Shakila, Gustafsson, Andreas, Seok, Seonho, Fryziel, Michel, Rolland, Paul-Alain, Grandchamp, Brice, Baggen, Rens

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Two-dimensional DC simulation methodology for InP/GaAs0.51Sb0.49/InP heterojunction bipolar transistor von Maneux, C., Belhaj, M., Grandchamp, B., Labat, N., Touboul, A.

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On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise von Grandchamp, Brice, Maneux, Cristell, Labat, Nathalie, Touboul, Andre, Zimmer, Thomas

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Procédé de fabrication de semi-conducteurs von PONS, Nicolas, GRANDCHAMP, Brice, ZHU, Rui, U'REN, Gregory, LACHAUME, Raphaël, BERBEZIER, Aude

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SEMICONDUCTOR FABRICATION PROCESS von PONS, Nicolas, LACHAUME, Raphael, GRANDCHAMP, Brice, ZHU, Rui, U'REN, Gregory, BERBEZIER, Aude

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Semiconductor fabrication process von Brice Grandchamp, Aude Berbezier, Rui Zhu, Nicolas Pons, Gregory U'ren, Raphael Lachaume

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Improved transfer printing for RF applications von Brice Grandchamp, Lucas Iogna-Prat, Imène Lahbib, Frédéric Drillet, Jérôme Loraine, Gregory U'ren

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