Efficient Overdetection Elimination of Acceptable Faults for Yield Improvement von Lee, K., Hsieh, T., Breuer, M. A.

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Testable MUTEX Design von Yang Zhang, Heck, Leandro S., Moreira, Matheus T., Zar, David, Breuer, Melvin A., Calazans, Ney L. V., Beerel, Peter A.

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An Error-Tolerance-Based Test Methodology to Support Product Grading for Yield Enhancement von Tong-Yu Hsieh, Kuen-Jong Lee, Breuer, Melvin A

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Intelligible test techniques to support error-tolerance von Breuer, M.A.

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Algorithms to maximize yield and enhance yield/area of pipeline circuitry by insertion of switches and redundant modules von Mirza-Aghatabar, Mohammad, Breuer, Melvin A, Gupta, Sandeep K

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Analytic models for crosstalk delay and pulse analysis under non-ideal inputs von Weiyu Chen, Gupta, S.K., Breuer, M.A.

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A new gate delay model for simultaneous switching and its applications von Chen, Liang-Chi, Gupta, Sandeep K., Breuer, Melvin A.

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Reduction of detected acceptable faults for yield improvement via error-tolerance von Hsieh, Tong-Yu, Lee, Kuen-Jong, Breuer, Melvin A.

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Novel test pattern generators for pseudoexhaustive testing von Srinivasan, R., Gupta, S.K., Breuer, M.A.

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Error Rate Estimation for Defective Circuits via Ones Counting von Pan, Zhaoliang, Breuer, Melvin A.

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Test Generation for Crosstalk-Induced Faults: Framework and Computational Results von Chen, Wei-yu, Gupta, Sandeep K, Breuer, Melvin A

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Test generation for crosstalk-induced faults: framework and computational results von Wei-Yu Chen, Gupta, S.K., Breuer, M.A.

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A new paradigm for trading off yield, area and performance to enhance performance per wafer von Gao, Yue, Breuer, Melvin A., Wang, Yanzhi

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Estimating Error Rate in Defective Logic Using Signature Analysis von Pan, Z., Breuer, M.A.

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Introducing redundant computations in RTL data paths for reducing BIST resources von Parulkar, Ishwar, Gupta, Sandeep K., Breuer, Melvin A.

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Fast optimal diagnosis procedures for k-out-of-n:G systems von Salloum, S., Breuer, M.A.

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Using explicit output comparisons for fault tolerant scheduling (FTS) on modern high-performance processors von Gao, Yue, Gupta, Sandeep K., Breuer, Melvin A.

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Optimal configuring of multiple scan chains von Narayanan, S., Gupta, R., Breuer, M.A.

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Efficient identification of crosstalk induced slowdown targets von Breuer, M.A., Gupta, S.K., Nazarian, S.

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Modeling and simulation for crosstalk aggravated by weak-bridge defects between on-chip interconnects von Lei Wang, Gupta, S.K., Breuer, M.A.

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