A new assessment for syndesmosis injury–the ‘Chertsey test’ von Boyd, Robert P.R, Nawaz, Zuhair S, Khaleel, Arshad

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The effect of electron cyclotron resonance plasma parameters on the aspect ratio of trenches in HgCdTe von STOLTZ, A. J, BENSON, J. D, BOYD, P. R, MARTINKA, M, VARESI, J. B, KALECZYC, A. W, SMITH, E. P. G, JOHNSON, S. M, RADFORD, W. A, DINAN, J. H

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Linkage disequilibrium mapping identifies a 390 kb region associated with CYP2D6 poor drug metabolising activity von Hosking, L K, Boyd, P R, Xu, C F, Nissum, M, Cantone, K, Purvis, I J, Khakhar, R, Barnes, M R, Liberwirth, U, Hagen-Mann, K, Ehm, M G, Riley, J H

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A langmuir probe investigation of electron cyclotron resonance argon-hydrogen plasmas von STOLTZ, A. J, SPERRY, M. J, BENSON, J. D, VARESI, J. B, MARTINKA, M, ALMEIDA, L. A, BOYD, P. R, DINAN, J. H

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Development of a high-selectivity process for electron cyclotron resonance plasma etching of II-VI semiconductors von STOLTZ, A. J, BENSON, J. D, THOMAS, M, BOYD, P. R, MARTINKA, M, DINAN, J. H

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Improved morphology and crystalline quality of MBE CdZnTe/Si von ALMEIDA, L. A, HIRSCH, L, MARTINKA, M, BOYD, P. R, DINAN, J. H

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Achilles tendon rupture: how to avoid missing the diagnosis von Boyd, Robert P R, Dimock, Richard, Solan, Matthew C, Porter, Edward

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Determination of the ion angular distribution for electron cyclotron resonance, plasma-etched HgCdTe trenches von BENSON, J. D, STOLTZ, A. J, VARESI, J. B, MARTINKA, M, KALECZYC, A. W, ALMEIDA, L. A, BOYD, P. R, DINAN, J. H

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Surface structure of plasma-etched (211)B HgCdTe von BENSON, J. D, STOLTZ, A. J, DINAN, J. H, VARESI, J. B, ALMEIDA, L. A, SMITH, E. P. G, JOHNSON, S. M, MARTINKA, M, KALECZYC, A. W, MARKUNAS, J. K, BOYD, P. R

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The use of a 3.5mm drill sleeve to harvest bone graft von Boyd, R P R, Avis, D J S, Dabke, H V

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Investigation of HgCdTe surface quality following br-based etching for device fabrication using spectroscopic ellipsometry von VARESI, J. B, BENSON, J. D, MARTINKA, M, STOLTZ, A. J, MASON, W. E, ALMEIDA, L. A, KALECZYC, A. W, BOYD, P. R, DINAN, J. H

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Threading dislocation removal from the near-surface region of epitaxial cadmium telluride on silicon by lithographic patterning of the substrate von MOLSTAD, J. C, BENSON, J. D, MARKUNAS, J. K, VARESI, J. B, BOYD, P. R, DINAN, J. H

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Effect of photoresist-feature geometry on electron-cyclotron resonance plasma-etch reticulation of HgCdTe diodes von BENSON, J. D, STOLTZ, A. J, KALECZYC, A. W, MARTINKA, M, ALMEIDA, L. A, BOYD, P. R, DINAN, J. H

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Macro-loading effects of electron-cyclotron resonance etched II-VI materials von STOLTZ, A. J, BENSON, J. D, VARESI, J. B, MARTINKA, M, SPERRY, M. J, KALECZYC, A. W, ALMEIDA, L. A, BOYD, P. R, DINAN, J. H

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Lithography factors that determine the aspect ratio of electron cyclotron resonance plasma etched HgCdTe trenches von BENSON, J. D, STOLTZ, A. J, DINAN, J. H, BOYD, P. R, MARTINKA, M, VARESI, J. B, ALMEIDA, L. A, OLVER, K. A, KALECZYC, A. W, JOHNSON, S. M, RADFORD, W. A

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Effects of a-Si:H resist vacuum-lithography processing on HgCdTe von JACOBS, R. N, ROBINSON, E. W, JAIME-VASQUEZ, M, STOLTZ, A. J, MARKUNAS, J, ALMEIDA, L. A, BOYD, P. R, DINAN, J. H, SALAMANCA-RIBA, L

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Photoluminescence of CdTe crystals grown by physical-vapor transport von PALOSZ, W, GRASZA, K, BOYD, P. R, CUT, Y, WRIGHT, G, ROY, U. N, BURGER, A

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Processing and characterization of a-Si:H photoresists for a vacuum-compatible photolithography process von JACOBS, R. N, STOLTZ, A. J, ROBINSON, E. W, BOYD, P. R, ALMEIDA, L. A, DINAN, J. H, SALAMANCA-RIBA, L

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Single-Nucleotide Polymorphism Alleles in the Insulin Receptor Gene Are Associated with Typical Migraine von McCarthy, Linda C., Hosford, David A., Riley, John H., Bird, Michael I., White, Nicola J., Hewett, Duncan R., Peroutka, Stephen J., Griffiths, Lyn R., Boyd, Pete R., Lea, Rod A., Bhatti, Shahid M., Hosking, Louise K., Hood, Chris M., Jones, Keith W., Handley, Abigail R., Rallan, Raj, Lewis, Karen F., Yeo, Astrid J.M., Williams, Pauline M., Priest, Richard C., Khan, Parveen, Donnelly, Christine, Lumsden, Sheena M., O'Sullivan, Jennifer, See, Chee Gee, Smart, Devi H., Shaw-Hawkins, Sue, Patel, Jaymini, Langrish, Tony C., Feniuk, Wasyl, Knowles, Richard G., Thomas, Malcolm, Libri, Vincenzo, Montgomery, Doug S., Manasco, Penny K., Xu, Chun-Fang, Dykes, Colin, Humphrey, Patrick P.A., Roses, Allen D., Purvis, Ian J.

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Antireflective structures in CdTe and CdZnTe surfaces by ECR plasma etching von STOLTZ, A. J, BANISH, M. R, DINAN, J. H, BENSON, J. D, BROWN, D. R, CHENAULT, D. B, BOYD, P. R

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