The Guelph PIXE software package IV von Campbell, J.L., Boyd, N.I., Grassi, N., Bonnick, P., Maxwell, J.A.

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Empirical simulations for further characterization of the Mars Science Laboratory Alpha Particle X-ray Spectrometer: An introduction to the ACES program von VanBommel, S.J., Gellert, R., Boyd, N.I., Hanania, J.U.

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Elemental composition of manganese- and phosphorus-rich nodules in the Knockfarril Hill member, Gale crater, Mars von VanBommel, S.J., Berger, J.A., Gellert, R., O'Connell-Cooper, C.D., McCraig, M.A., Thompson, L.M., Fedo, C.M., Des Marais, D.J., Fey, D.M., Yen, A.S., Clark, B.C., Treiman, A.H., Boyd, N.I.

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Constraining the chemical depth profile of a manganese-rich surface layer in Gale crater, Mars von VanBommel, S.J., Gellert, R., Berger, J.A., McCraig, M.A., O'Connell-Cooper, C.D., Thompson, L.M., Yen, A.S., Boyd, N.I., Lanza, N.L., Ollila, A.M.

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Mars Science Laboratory Alpha Particle X-ray spectrometer trace elements: Situational sensitivity to Co, Ni, Cu, Zn, Ga, Ge, and Br von VanBommel, S.J., Gellert, R., Berger, J.A., Yen, A.S., Boyd, N.I.

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The Mars Science Laboratory APXS calibration target: Comparison of Martian measurements with the terrestrial calibration von Campbell, J.L., King, P.L., Burkemper, L., Berger, J.A., Gellert, R., Boyd, N.I., Perrett, G.M., Pradler, I., Thompson, L., Edgett, K.S., Yingst, R.A.

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