Calculation of the binomial survivor function (reliability applications) von Bowerman, P.N., Scheuer, E.M.

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Calculation of the Poisson cumulative distribution function (reliability applications) von Bowerman, P.N., Nolty, R.G., Scheuer, E.M.

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Systems and methods for circuit lifetime evaluation von Heaps, Timothy L., Sheldon, Douglas J., Bowerman, Paul N., Everline, Chester J., Shalom, Eddy, Rasmussen, Robert D.

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Systems and methods for circuit lifetime evaluation von SHELDON DOUGLAS J, BOWERMAN PAUL N, HEAPS TIMOTHY L, SHALOM EDDY, EVERLINE CHESTER J, RASMUSSEN ROBERT D

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SYSTEMS AND METHODS FOR CIRCUIT LIFETIME EVALUATION von SHELDON DOUGLAS J, BOWERMAN PAUL N, HEAPS TIMOTHY L, SHALOM EDDY, EVERLINE CHESTER J, RASMUSSEN ROBERT D

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Reliability of two dependent paralleled devices with application to the electromigration failure phenomenon von Wanchoo, Anna-Karin M., Scheuer, Ernest M., Bowerman, Paul N.

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A Randomized Trial Comparing Telemedicine Case Management with Usual Care in Older, Ethnically Diverse, Medically Underserved Patients with Diabetes Mellitus: 5 Year Results of the... von Shea, Steven, Weinstock, Ruth S., Teresi, Jeanne A., Palmas, Walter, Starren, Justin, Cimino, James J., Lai, Albert M., Field, Lesley, Morin, Philip C., Goland, Robin, Izquierdo, Roberto E., Ebner, Susana, Silver, Stephanie, Petkova, Eva, Kong, Jian, Eimicke, Joseph P.

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