A finite strain model of stress, diffusion, plastic flow, and electrochemical reactions in a lithium-ion half-cell von Bower, A.F., Guduru, P.R., Sethuraman, V.A.

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The influence of serrated flow on necking in tensile specimens von Zhang, F., Bower, A.F., Curtin, W.A.

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In Situ Measurements of Stress-Potential Coupling in Lithiated Silicon von Sethuraman, V. A., Srinivasan, V., Bower, A. F., Guduru, P. R.

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Real-time stress measurements in lithium-ion battery negative-electrodes von Sethuraman, V.A., Van Winkle, N., Abraham, D.P., Bower, A.F., Guduru, P.R.

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A simple finite element model of diffusion, finite deformation, plasticity and fracture in lithium ion insertion electrode materials von Bower, A F, Guduru, P R

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Finite element implementation of a kinetic model of dynamic strain aging in aluminum-magnesium alloys von Zhang, F., Bower, A. F., Curtin, W. A.

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A simple technique for avoiding convergence problems in finite element simulations of crack nucleation and growth on cohesive interfaces von Gao, Y F, Bower, A F

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Numerical simulations of necking during tensile deformation of aluminum single crystals von Zhang, F., Bower, A.F., Mishra, R.K., Boyle, K.P.

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Quantum-to-continuum prediction of ductility loss in aluminium–magnesium alloys due to dynamic strain aging von Keralavarma, S. M., Bower, A. F., Curtin, W. A.

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A three-dimensional model of electromigration and stress induced void nucleation in interconnect structures von Singh, N, Bower, A F, Shankar, S

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Kinetics of Sn whisker nucleation using thermally induced stress von Pei, F., Briant, C.L., Kesari, H., Bower, A.F., Chason, E.

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A multiscale approach to modeling formability of dual-phase steels von Srivastava, A, Bower, A F, Hector, L G, Carsley, J E, Zhang, L, Abu-Farha, F

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Numerical simulations of island formation in a coherent strained epitaxial thin film system von Zhang, Y.W., Bower, A.F.

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Significance of Nucleation Kinetics in Sn Whisker Formation von Chason, E., Pei, F., Briant, C. L., Kesari, H., Bower, A. F.

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The behavior of an elastic–perfectly plastic sinusoidal surface under contact loading von Gao, Y.F., Bower, A.F., Kim, K.-S., Lev, L., Cheng, Y.T.

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A finite element analysis of the motion and evolution of voids due to strain and electromigration induced surface diffusion von Xia, L., Bower, A.F., Suo, Z., Shih, C.F.

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A simple technique for avoiding convergence problems in finite element simulations of crack nucleation and growth on cohesive interfaces von Gao, Y F, Bower, A F

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Morphological evolution driven by strain induced surface diffusion von Zhang, Y.W., Bower, A.F., Liu, P.

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Plastic deformation processes in Cu/Sn bimetallic films von Kumar, K.S., Reinbold, L., Bower, A.F., Chason, E.

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Delamination mechanism maps for a strong elastic coating on an elastic–plastic substrate subjected to contact loading von Xia, S.M., Gao, Y.F., Bower, A.F., Lev, L.C., Cheng, Y.-T.

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