Characterization of defect microstructure in MgRE (RE=Ce, Nd) alloys after processing by high-pressure torsion using positron annihilation spectroscopy and a high resolution X-ray... von Bibimoune, I., Bourezg, Y.I., Abib, K., Liedke, M.O., Wagner, A., Matej, Z., Huang, Y., Langdon, T.G., Bradai, D.

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GaN nanocrystals obtained by Ga and N implantations and thermal treatment under N2 into SiO2/Si and SiNx/Si wafers von Aggar, L., Bradai, D., Bourezg, Y.I., Abdesselam, M., Chami, A.C., Mocuta, C., Thiaudiere, D., Speisser, C., Muller, D., Bouillet, C., Le Normand, F.

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