Mechanical Properties of Southern Pine Cross-Laminated Timber von Hindman, Daniel P, Bouldin, John C

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Interfacial properties of ZrO2 on silicon von Lin, Y.-S., Puthenkovilakam, R., Chang, J. P., Bouldin, C., Levin, I., Nguyen, N. V., Ehrstein, J., Sun, Y., Pianetta, P., Conard, T., Vandervorst, W., Venturo, V., Selbrede, S.

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DIFFRACTION ANOMALOUS FINE-STRUCTURE - A NEW X-RAY STRUCTURAL TECHNIQUE von STRAGIER, H, CROSS, JO, REHR, JJ, SORENSEN, LB, BOULDIN, CE, WOICIK, JC

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Quantitative analysis of the effects of acoustic neurostimulation on the neuropsychology of healthy adults von Radiance C. Bouldin, Julia R. Higdon, Jonghoon Kang

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Parallel calculation of electron multiple scattering using Lanczos algorithms von Ankudinov, A. L., Bouldin, C. E., Rehr, J. J., Sims, J., Hung, H.

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Direct separation of short range order in intermixed nanocrystalline and amorphous phases von Frenkel, Anatoly I, Kolobov, Alexander V, Robinson, Ian K, Cross, Julie O, Maeda, Yoshihito, Bouldin, Charles E

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Inspection of I-Joists in Residential Construction von Bouldin, John C, Loferski, Joseph R, Hindman, Daniel P

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Inspection of Metal Plate–Connected Wood Trusses in Residential Construction von Bouldin, John C, Loferski, Joseph R, Hindman, Daniel P

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The Soft X-ray Imager (SXI) on the SMILE Mission von Sembay, S., L. Alme, A., Agnolon, D., Arnold, T., Beardmore, A., Belén Balado Margeli, A., Bicknell, C., Bouldin, C., Branduardi-Raymont, G., Crawford, T., P. Breuer, J., Buggey, T., Butcher, G., Canchal, R., A. Carter, J., Cheney, A., Collado-Vega, Y., Connor, H., Eaton, N., Feldman, C., Forsyth, C., Frantzen, T., Galgóczi, G., Garcia, J., Y. Genov, G., Gordillo, C., Gröbelbauer, H-P., Guedel, M., Guo, Y., Hailey, M., Hall, D., Hampson, R., Hasiba, J., Hetherington, O., Holland, A., Hsieh, S-Y., W. J. Hubbard, M., Jeszenszky, H., Jones, M., Kennedy, T., Koch-Mehrin, K., Kögl, S., Krucker, S., D. Kuntz, K., Laky, G., Lylund, O., Martindale, A., Miguel Mas Hesse, J., Nakamura, R., Oksavik, K., Østgaard, N., Ottacher, H., Ottensamer, R., Pagani, C., Parsons, S., Patel, P., Pearson, J., Peikert, G., S. Porter, F., Pouliantis, T., H. Qureshi, B., Raab, W., Randall, G., M. Read, A., M. M. Roque, N., E. Rostad, M., Runciman, C., Sachdev, S., Samsonov, A., Soman, M., Sibeck, D., Smit, S., Søndergaard, J., Speight, R., Stavland, S., Steller, M., Sun, TianRan, Thornhill, J., Thomas, W., Ullaland, K., Walsh, B., Walton, D., Wang, C., Yang, S.

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Surface extended-X-ray-absorption fine structure and scanning tunneling microscopy of Si(001) 2×1-Sb von RICHTER, M, WOICIK, J. C, PIANETTA, P, MIYANO, K. E, BASKI, A. A, KENDELEWICZ, T, BOULDIN, C. E, SPICER, W. E, QUATE, C. F, LINDAU, I

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Thermal expansion coefficients of low-k dielectric films from Fourier analysis of x-ray reflectivity von Bouldin, C. E., Wallace, W. E., Lynn, G. W., Roth, S. C., Wu, W. L.

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MacXAFS: An EXAFS analysis package for the Macintosh von Bouldin, C., Furenlid, L., Elam, T.

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Extended x-ray absorption fine structure study of AlxGa(1−x)N films von Miyano, K. E., Woicik, J. C., Robins, Lawrence H., Bouldin, C. E., Wickenden, D. K.

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Rapid calculation of x-ray absorption near edge structure using parallel computation von Bouldin, C., Sims, J., Hung, H., Rehr, J. J., Ankudinov, A. L.

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X-RAY STANDING-WAVE DETERMINATION OF THE CLEAN INP(110) SURFACE RECONSTRUCTION von WOICIK, JC, KENDELEWICZ, T, MIYANO, KE, COWAN, PL, BOULDIN, CE, KARLIN, BA, PIANETTA, P, SPICER, WE

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Edge separation using diffraction anomalous fine structure von Ravel, B., Bouldin, C. E., Renevier, H., Hodeau, J.-L., Berar, J.-F.

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Structural unit in icosahedral MnAlSi and MnAl von MA, Y, STER, E. A, BOULDIN, C. E

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Local structure at Mn sites in icosahedral Mn-Al quasicrystals von STERN, E. A, MA, Y, BOULDIN, C. E

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Strontium-induced oxygen defect structure and hole doping in La2-xSrxCuO4 von ZHENGQUAN TAN, FILIPKOWSKI, M. E, BUDNICK, J. I, HELLER, E. K, BREWE, D. L, CHAMBERLAND, B. L, BOULDIN, C. E, WOICIK, J. C, SHI, D

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Sample-angle feedback for diffraction anomalous fine-structure spectroscopy von Cross, J. O., Elam, W. T., Harris, V. G., Kirkland, J. P., Bouldin, C. E., Sorensen, L. B.

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