Etude des phénomènes de transport de porteurs et du bruit basse fréquence en fonction de la température dans les transistors FinFET et GAA NWFET sub-10 nm von Boudier, Dimitri

Volltext bestellen

(Invited) Generation-Recombination Noise in Advanced CMOS Devices von Simoen, Eddy, Oliveira, Alberto Vinícius de, Boudier, Dimitri, Mitard, Jerome, Witters, Liesbeth, Veloso, Anabela, Agopian, Paula Ghedini Der, Martino, Joao Antonio, Carin, Regis, Cretu, Bogdan, Langer, Robert, Collaert, Nadine, Thean, Aaron, Claeys, Cor

Volltext

(Invited) Generation-Recombination Noise in Advanced CMOS Devices von Simoen, Eddy, Oliveira, Alberto Vinícius de, Boudier, Dimitri, Mitard, Jerome, Witters, Liesbeth, Veloso, Anabela, Agopian, Paula Ghedini Der, Martino, Joao Antonio, Carin, Regis, Cretu, Bogdan, Langer, Robert, Collaert, Nadine, Thean, Aaron, Claeys, Cor

Volltext

Discussion of the flicker noise origin at very low temperature and polarisation operation von Boudier, Dimitri, Cretu, Bogdan, Simoen, Eddy, Veloso, Anabela, Claeys, Cor

Volltext bestellen

Processing Impact on the Low-Frequency Noise of 1.8V Input-Output Bulk FinFETs von Claeys, Cor, Hellings, Geert, Arimura, Hiroaki, Parvais, Bertrand, Ragnarsson, Lars-Åke, Dekkers, Harold, Schram, Tom, Linten, Dimitri, Horiguchi, Naoto, Simoen, Eddy, Boudier, Dimitri, Cretu, Bogdan

Volltext bestellen