Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical response von Geandier, G., Thiaudière, D., Randriamazaoro, R. N., Chiron, R., Djaziri, S., Lamongie, B., Diot, Y., Le Bourhis, E., Renault, P. O., Goudeau, P., Bouaffad, A., Castelnau, O., Faurie, D., Hild, F.

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From the Limit Test for Trace Elements Control to the Elemental Impurities Analysis by Inductively Coupled Plasma Optical Emission Spectrometry: Application on Six Samples of Metro... von Matmour, Derouicha, Bouaffad, Abir, Merad, Yassine, Ziani, Nassima Hamdi

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