Impact of Particle Radiation and Temperature on the Retention Time of DDR4 SDRAM Cells von Bosser, Alexandre L., Kohler, Pierre, Rodriguez, Axel, Wang, Pierre-Xiao

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Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence von Javanainen, Arto, Galloway, Kenneth F., Nicklaw, Christopher, Bosser, Alexandre L., Ferlet-Cavrois, Veronique, Lauenstein, Jean-Marie, Pintacuda, Francesco, Reed, Robert A., Schrimpf, Ronald D., Weller, Robert A., Virtanen, Ari

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Heavy-Ion-Induced Degradation in SiC Schottky Diodes: Incident Angle and Energy Deposition Dependence von Javanainen, Arto, Turowski, Marek, Galloway, Kenneth F., Nicklaw, Christopher, Ferlet-Cavrois, Veronique, Bosser, Alexandre, Lauenstein, Jean-Marie, Muschitiello, Michele, Pintacuda, Francesco, Reed, Robert A., Schrimpf, Ronald D., Weller, Robert A., Virtanen, A.

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Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory von Bosser, A. L., Gupta, V., Javanainen, A., Tsiligiannis, G., LaLumondiere, S. D., Brewe, D., Ferlet-Cavrois, V., Puchner, H., Kettunen, H., Gil, T., Wrobel, F., Saigne, F., Virtanen, A., Dilillo, L.

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Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions von Gupta, Viyas, Bosser, Alexandre, Tsiligiannis, Georgios, Zadeh, Ali, Javanainen, Arto, Virtanen, Ari, Puchner, Helmut, Saigne, Frederic, Wrobel, Frederic, Dilillo, Luigi

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Methodologies for the Statistical Analysis of Memory Response to Radiation von Bosser, Alexandre L., Gupta, Viyas, Tsiligiannis, Georgios, Frost, Christopher D., Zadeh, Ali, Jaatinen, Jukka, Javanainen, Arto, Puchner, Helmut, Saigne, Frederic, Virtanen, Ari, Wrobel, Frederic, Dilillo, Luigi

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SRAM-based heavy ion beam flux and LET dosimetry von Coronetti, Andrea, Garcia-Alia, Ruben, Dilillo, Luigi, Imianosky, Carolina, Dos Santos, Douglas Almeida, Luza, Lucas Matana, Bosser, Alexandre, Bilko, Kacper, Waets, Andreas, Klimek, Karolina, Saigne, Frederic

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Soft errors in commercial off-the-shelf static random access memories von Dilillo, L, Tsiligiannis, G, Gupta, V, Bosser, A, Saigne, F, Wrobel, F

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Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs von Bosser, A., Gupta, V., Tsiligiannis, G., Javanainen, A., Kettunen, H., Puchner, H., Saigne, F., Virtanen, A., Wrobel, F., Dilillo, L.

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Particle telescope aboard FORESAIL-1: Simulated performance von Oleynik, Philipp, Vainio, Rami, Hedman, Hannu-Pekka, Punkkinen, Arttu, Punkkinen, Risto, Salomaa, Lassi, Säntti, Tero, Tuominen, Jarno, Virtanen, Pasi, Bosser, Alexandre, Janhunen, Pekka, Kilpua, Emilia, Palmroth, Minna, Praks, Jaan, Slavinskis, Andris, Kakakhel, Syed R.U., Peltonen, Juhani, Plosila, Juha, Tammi, Jani, Tenhunen, Hannu, Westerlund, Tomi

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Dynamic Test Methods for COTS SRAMs von Tsiligiannis, G., Dilillo, L., Gupta, V., Bosio, A., Girard, P., Virazel, A., Puchner, H., Bosser, A., Javanainen, A., Virtanen, A., Frost, C., Wrobel, F., Dusseau, L., Saigne, F.

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SEE on Different Layers of Stacked-SRAMs von Gupta, V., Bosser, A., Tsiligiannis, G., Rousselet, M., Mohammadzadeh, A., Javanainen, A., Virtanen, A., Puchner, H., Saigne, F., Wrobel, F., Dilillo, L.

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Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs von Bosser, Alexandre Louis, Gupta, Viyas, Tsiligiannis, Georgios, Javanainen, Arto, Kettunen, Heikki, Puchner, Helmut, Saigné, Frédéric, Virtanen, Ari, Wrobel, Frédéric, Dilillo, Luigi

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Single-event effects from space and atmospheric radiation in memory components von Bosser, Alexandre Louis

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Heavy Ion Induced Degradation in SiC Schottky Diodes: Bias and Energy Deposition Dependence von Javanainen, Arto, Galloway, Kenneth F., Nicklaw, Christopher, Bosser, Alexandre L., Ferlet-Cavrois, Veronique, Lauenstein, Jean-Marie, Pintacuda, Francesco, Reed, Robert A., Schrimpf, Ronald D., Weller, Robert A., Virtanen, Ari Juha

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SEGR in SiO[Formula Omitted]-Si[Formula Omitted]N[Formula Omitted] Stacks von Javanainen, Arto, Ferlet-Cavrois, Veronique, Bosser, Alexandre, Jaatinen, Jukka, Kettunen, Heikki, Muschitiello, Michele, Pintacuda, Francesco, Rossi, Mikko, Schwank, James R, Shaneyfelt, Marty R, Virtanen, Ari

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SEGR in SiO 2 -Si 3 N 4 Stacks von Javanainen, Arto, Ferlet-Cavrois, Véronique, Bosser, Alexandre, Jaatinen, Jukka, Kettunen, Heikki, Muschitiello, Michele, Pintacuda, Francesco, Rossi, Mikko, Schwank, James R., Shaneyfelt, Marty R., Virtanen, Ari

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MCU data in a Cypress 65 nm SRAM from heavy ions and protons collected at ground facilities von Coronetti, Andrea, Luza, Lucas Matana, Bosser, Alexandre, Alía, Rubén García, Dilillo, Luigi, , Frédéric

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Particle Telescope aboard FORESAIL-1: simulated performance von Oleynik, Philipp, Vainio, Rami, Hedman, Hannu-Pekka, Punkkinen, Arttu, Punkkinen, Risto, Salomaa, Lassi, Säntti, Tero, Tuominen, Jarno, Virtanen, Pasi, Bosser, Alexandre, Janhunen, Pekka, Kilpua, Emilia, Palmroth, Minna, Praks, Jaan, Slavinskis, Andris, Kakakhel, Syed R U, Peltonen, Juhani, Plosila, Juha, Jani Tammi, Tenhunen, Hannu, Westerlund, Tomi

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The epidemiology of vertigo, dizziness, and unsteadiness and its links to co-morbidities von Bisdorff, Alexandre, Bosser, Gilles, Gueguen, René, Perrin, Philippe

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