ESD design challenges in state-of-the-art analog technologies von Boselli, G.

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Changes in quality of life after thyroidectomy in subjects with thyroid cancer in relation to the dose of levothyroxine von Monzani, M. L., Piccinini, F., Boselli, G., Corleto, R., Margiotta, G., Peeters, R. P., Simoni, M., Brigante, G.

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COVID-19 lockdown negatively impacted on adherence to denosumab therapy: incidence of non-traumatic fractures and role of telemedicine von De Vincentis, S., Domenici, D., Ansaloni, A., Boselli, G., D’Angelo, G., Russo, A., Taliani, E., Rochira, V., Simoni, M., Madeo, B.

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Mitotic Exit Regulation through Distinct Domains within the Protein Kinase Cdc15 von Bardin, Allison J., Boselli, Monica G., Amon, Angelika

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Novel Response to Microtubule Perturbation in Meiosis von Hochwagen, Andreas, Wrobel, Gunnar, Cartron, Marie, Demougin, Philippe, Niederhauser-Wiederkehr, Christa, Boselli, Monica G., Primig, Michael, Amon, Angelika

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RF CMOS on high-resistivity substrates for system-on-chip applications von Benaissa, K., Jau-Yuann Yang, Crenshaw, D., Williams, B., Sridhar, S., Ai, J., Boselli, G., Song Zhao, Shaoping Tang, Ashburn, S., Madhani, P., Blythe, T., Mahalingam, N., Shichijo, H.S.

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The Effects of Angle of Incidence and Temperature on Latchup in 65 nm Technology von Hutson, J.M., Pellish, J.D., Boselli, G., Baumann, R., Reed, R.A., Schrimpf, R.D., Weller, R.A., Massengill, L.W.

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Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies von Boselli, G., Duvvury, C.

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Amplitude control of cell-cycle waves by nuclear import von Becskei, Attila, Boselli, Monica G., Oudenaarden, Alexander van

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Evidence for Lateral Angle Effect on Single-Event Latchup in 65 nm SRAMs von Hutson, J.M., Pellish, J.A., Tipton, A.D., Boselli, G., Xapsos, M.A., Kim, H., Friendlich, M., Campola, M., Seidleck, S., LaBel, K., Marshall, A., Deng, X., Baumann, R., Reed, R.A., Schrimpf, R.D., Weller, R.A., Massengill, L.W.

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DNA stability and schizophrenia in twins von Nguyen, Giang H., Bouchard, Joseph, Boselli, Monica G., Tolstoi, Linda G., Keith, Louis, Baldwin, Clinton, Nguyen, Nam C., Schultz, Mark, Herrera, Victoria L.M., Smith, Cassandra L.

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Latch-up in 65nm CMOS technology: a scaling perspective von Boselli, G., Reddy, V., Duvvury, C.

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Innovative tools to improve children's eating habits. Nutritional educational farms vs gardening and taste shops von Caroli, M., Urso, E., Tomaselli, M.A., Sturdà, A., Boselli, G., Barberio, R.

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Properties of Digital Switching Currents in Fully CMOS Combinational Logic von Boselli, G, Trucco, G, Liberali, V

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Analysis and Measurement of Crosstalk Effects on Mixed-Signal CMOS ICs With Different Mounting Technologies von Ferragina, V, Ghittori, N, Torelli, G, Boselli, G, Trucco, G, Liberali, V

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Overshoot-induced failures in forward-biased diodes: A new challenge to high-speed ESD design von Farbiz, F., Appaswamy, A., Salman, A. A., Boselli, G.

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A MOSFET power supply clamp with feedback enhanced triggering for ESD protection in advanced CMOS technologies von Smith, Jeremy C., Boselli, Gianluca

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Engineering optimal high current characteristics of high voltage DENMOS von Salman, Akram A., Farbiz, F., Appaswamy, A., Kunz, H., Boselli, G., Dissegna, M.

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Drain Extended NMOS High Current Behavior and ESD Protection Strategy for HV Applications in Sub-100nm CMOS Technologies von Boselli, G., Vassilev, V., Duvvury, C.

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Electronic design automation (EDA) solutions for ESD-robust design and verification von Khazhinsky, M. G., Cao, S., Gossner, H., Boselli, G., Etherton, M.

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