Single-particle cryo-EM structures from iDPC–STEM at near-atomic resolution von Lazić, Ivan, Wirix, Maarten, Leidl, Max Leo, de Haas, Felix, Mann, Daniel, Beckers, Maximilian, Pechnikova, Evgeniya V., Müller-Caspary, Knut, Egoavil, Ricardo, Bosch, Eric G. T., Sachse, Carsten

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Phase contrast scanning transmission electron microscopy imaging of light and heavy atoms at the limit of contrast and resolution von Yücelen, Emrah, Lazić, Ivan, Bosch, Eric G. T.

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A single-molecule van der Waals compass von Shen, Boyuan, Chen, Xiao, Wang, Huiqiu, Xiong, Hao, Bosch, Eric G. T., Lazić, Ivan, Cai, Dali, Qian, Weizhong, Jin, Shifeng, Liu, Xin, Han, Yu, Wei, Fei

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Phase contrast STEM for thin samples: Integrated differential phase contrast von Lazić, Ivan, Bosch, Eric G.T., Lazar, Sorin

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Atomic imaging of zeolite-confined single molecules by electron microscopy von Shen, Boyuan, Wang, Huiqiu, Xiong, Hao, Chen, Xiao, Bosch, Eric G. T., Lazić, Ivan, Qian, Weizhong, Wei, Fei

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Imaging atomic motion of light elements in 2D materials with 30 kV electron microscopy von de Graaf, Sytze, Ahmadi, Majid, Lazi, Ivan, Bosch, Eric G. T, Kooi, Bart J

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Analysis of HR-STEM theory for thin specimen von Bosch, Eric G.T., Lazić, Ivan

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Analysis of depth-sectioning STEM for thick samples and 3D imaging von Bosch, Eric G.T., Lazić, Ivan

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Differential phase contrast (DPC) mapping electric fields: Optimising experimental conditions von Li, Chen, Mu, Xiaoke, Korytov, Maxim, Alexandrou, Ioannis, Bosch, Eric G. T.

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Visualization of Dopant Oxygen Atoms in a Bi2Sr2CaCu2O8+δ Superconductor von Song, Dongsheng, Zhang, Xuefeng, Lian, Chaosheng, Liu, Hai, Alexandrou, Ioannis, Lazić, Ivan, Bosch, Eric G. T., Zhang, Ding, Wang, LiLi, Yu, Rong, Cheng, Zhiying, Song, Canli, Ma, Xucun, Duan, Wenhui, Xue, Qikun, Zhu, Jing

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3D characterization of nanowire devices with STEM based modes von Bender, Hugo, Bosch, Eric G T, Richard, Olivier, Mendez, David, Favia, Paola, Lazi, Ivan

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Quarantotto: A 48-segment STEM detector for enhanced STEM performance and new applications von Vespucci, Stefano, Bosch, Eric G. T., Lazić, Ivan, de Vries, Bert, Egoavil, Ricardo, Freitag, Bert, Grieb, Tim, Krause, Florian F., Eickhoff, Martin, Rosenauer, Andreas

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Real-time imaging of atomic potentials in 2D materials with 30 keV electrons von de Graaf, Sytze, Ahmadi, Majid, Lazić, Ivan, Bosch, Eric G T, Kooi, Bart J

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A quantitative model for doping contrast in the scanning electron microscope using calculated potential distributions and Monte Carlo simulations von Chee, Augustus K. W., Broom, Ronald F., Humphreys, Colin J., Bosch, Eric G. T.

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Integrated differential phase contrast (iDPC) STEM von Lazic, Ivan, Bosch, Eric G. T., Lazar, Sorin

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Visualization of Dopant Oxygen Atoms in a Bi 2 Sr 2 CaCu 2 O 8+ δ Superconductor von Song, Dongsheng, Zhang, Xuefeng, Lian, Chaosheng, Liu, Hai, Alexandrou, Ioannis, Lazić, Ivan, Bosch, Eric G. T., Zhang, Ding, Wang, LiLi, Yu, Rong, Cheng, Zhiying, Song, Canli, Ma, Xucun, Duan, Wenhui, Xue, Qikun, Zhu, Jing

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Integrated Differential Phase Contrast (iDPC) STEM: A New Atomic Resolution STEM Technique To Image All Elements Across the Periodic Table von Bosch, Eric G.T., Lazic, Ivan, Lazar, Sorin

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Integrated Differential Phase Contrast (iDPC)–Direct Phase Imaging in STEM for Thin Samples von Lazic, Ivan, Bosch, Eric G.T., Lazar, Sorin, Wirix, Maarten, Yücelen, Emrah

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Real-time imaging of atomic electrostatic potentials in 2D materials with 30 keV electrons von de Graaf, Sytze, Ahmadi, Majid, Lazić, Ivan, Bosch, Eric G.T., Kooi, Bart J.

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Low Dose Imaging Using Simultaneous iDPC- and ADF-STEM for Beam Sensitive Crystalline Structures von Carlsson, Anna, Alexandrou, Ioannis, Yücelen, Emrah, Bosch, Eric G.T., Lazić, Ivan

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