Ellipsometry of monolayers of metallic nanoparticles taking into account depolarization von Bortchagovsky, E.G., Mishakova, T.O., Hingerl, K.

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Deficiency of Standard Effective-Medium Approximation for Ellipsometry of Layers of Nanoparticles von Lozovski, V. Z., Jastrabik, L., Dejneka, A., Bortchagovsky, E. G., Mishakova, T. O.

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The shape of transmission spectra of thin films deposited on a substrate von Bortchagovsky, E G, Fischer, U C, Fuchs, H

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Some artefacts of the approaches with the discretization in near-field optics calculations von BORTCHAGOVSKY, E.G

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Reflection polarized light microscopy and its application to pyrolytic carbon deposits von Bortchagovsky, E. G.

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Ellipsometric method for investigation of the optical anisotropy of thin films: theory and calculations von Bortchagovsky, E.G.

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Simple Modeling of the Ratio of Fields at a Tip and a Contacting Surface with External Illumination von Bortchagovsky, E. G.

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Simple modeling of the ratio of fields at a tip and at contacting surface von Bortchagovsky, E. G.

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Methane as a novel doping precursor for deposition of highly conductive ZnO thin films by magnetron sputtering von Vasin, A.V., Rusavsky, A.V., Bortchagovsky, E.G., Gomeniuk, Y.V., Nikolenko, A.S., Strelchuk, V.V., Yatskiv, R., Tiagulskyi, S., Prucnal, S., Skorupa, W., Nazarov, A.N.

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On the modulation of optical transmission spectra of thin dye layers by a supporting medium von Bortchagovsky, E. G., Fischer, U. C.

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Optical properties of pyrolytic carbon deposits deduced from measurements of the extinction angle by polarized light microscopy von Bortchagovsky, E.G., Reznik, B., Gerthsen, D., Pfrang, A., Schimmel, Th

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Optical properties of double-layer structure phthalocyanine–tetracyanoquinodimethane von Bortchagovsky, E.G., Kazantseva, Z.I., Koshets, I.A., Nešpůrek, S., Jastrabik, L.

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Luminescent analysis of the quality of CdS nanocrystals depending on technological parameters von Bogoslovskaya, A.B.

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Spectral-ellipsometric examining the films of gold nanoparticles on Si/SiO2 substrate von Bortchagovsky, E. G.

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Ellipsometric monitoring of molecular evolution in freely suspended films of M12/10 ferroelectric liquid crystal von Bortchagovsky, E.G., Deineka, A., Glogarová, M., Hamplová, V., Jastrabı́k, L., Kašpar, M.

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Invisible layers in ellipsometry von Bortchagovsky, E.G., Getsko, O.M.

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Direct synthesized graphene-like film on SiO2: Mechanical and optical properties von Bortchagovsky, E.G.

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Ellipsometric method in near-field recording von Bortchagovsky, Eugene G.

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Electric field influence on freely suspended films of liquid crystal E10/8 with flexible core in the temperature region of smectic A - smectic C phase transition von Bortchagovsky, E. G., Deineka, A., Glogarova, M., Hamplova, V., Jastrabik, L., Kašpar, M.

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Model of the effective-medium approximation for nanostructured layers with the account of interparticle interactions and its ellipsometric registration von E. G. Bortchagovsky, A. Dejneka, L. Jastrabik, V. Z. Lozovski, T. O. Mishakova

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