Editorial von Arnold, G.W., Borders, J.A.

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Aggregation and migration of ion-implanted silver in lithia-alumina-silica glass von Arnold, G. W., Borders, J. A.

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Surface composition and erosion yields for CVD TiB 2 films subjected to low energy deuterium ion bombardment von Nelson, G.C., Borders, J.A.

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The use of 12C(d, p) 13C and 16O(d, p) 17O reactions to profile carbon and oxygen in solids von Borders, J.A., Harris, J.M.

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Ion back-scattering analysis of interdiffusion in Cu-Au thin films von Borders, J.A.

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Sputtering and surface modification of TiC coatings by low energy deuterium bombardment von Borders, J.A., Nelson, G.C.

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Deuteron stopping cross sections in transition metal hydrides von Malbrough, D.J., Brice, D.K., Cowgill, D.F., Borders, J.A., Shope, L.A., Harris, J.M.

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Analysis of coatings and thin films using energetic ions von Borders, J.A.

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Helium ion stopping cross sections in gold von Borders, J. A.

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FORMATION OF SiC IN SILICON BY ION IMPLANTATION von Borders, J. A., Picraux, S. T., Beezhold, W.

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Characterization of silicon metallization systems using energetic ion backscattering von Borders, J.A., Picraux, S.T.

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Surface composition and erosion yields for CVD TiB2 films subjected to low energy deuterium ion bombardment von Nelson, G.C., Borders, J.A.

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Helium ion stopping cross sections in bismuth, lead and tungsten von Borders, J. A.

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Low‐energy ion beam system for materials studies von Nelson, G. C., Borders, J. A., Oborny, M. C.

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The physical state of implanted tungsten in copper von Cullis, A. G., Poate, J. M., Borders, J. A.

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DIRECT EVIDENCE OF DIVACANCY FORMATION IN SILICON BY ION IMPLANTATION von Stein, H. J., Vook, F. L., Borders, J. A.

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Long-term changes in the surface conditions of PLT von Cohen, S.A., Dylla, H.F., Rossnagel, S.M., Picraux, S.T., Borders, J.A., Magee, C.W.

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Ion implantation as an ultrafast quenching technique for metastable alloy production: The Ag-Cu system von Poate, J. M., Borders, J. A., Cullis, A. G., Hirvonen, J. K.

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Low energy hydrogen and deuterium sputtering measurements of stainless steel, graphite, and beryllium oxide von Borders, J.A., Langley, R.A., Wilson, K.L.

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16O contamination in 4He analysis beams von Picraux, S.T., Borders, J.A., Langley, R.A.

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