Mechanism for CuPt-type ordering in mixed III–V epitaxial layers von Philips, B.A., Norman, A.G., Seong, T.Y., Mahajan, S., Booker, G.R., Skowronski, M., Harbison, J.P., Keramidas, V.G.

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Impact of ex-situ and in-situ cleans on the performance of bipolar transistors with low thermal budget in-situ phosphorus-doped polysilicon emitter contacts von Rahim, A.I.A., Marsh, C.D., Ashburn, P., Booker, G.R.

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Creep Properties of Advanced Heat-Resistant Martensitic Steels Strengthened by L1o Type Ordered Intermetallic Phase von Muneki, Seiichi, Igarashi, M., Booker, G.R.

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Heterogeneous Changes in Microstructure and Degradation Behaviour of 9Cr-1Mo-V-Nb Steel During Long Term Creep von Kimura, K., Kushima, H., Booker, G.R.

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Contribution of Tungsten to Microstructure Stabilization and Improvement of Creep Resistance in Simple 9Cr-W Steels von Booker, G.R.

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Thermal processing induced plastic deformation in GaAs wafers von Möck, P., Laczik, Z.J., Booker, G.R.

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MOVPE grown self-assembled and self-ordered InSb quantum dots in a GaSb matrix assessed by AFM, CTEM, HRTEM and PL von Möck, P., Booker, G.R., Mason, N.J., Nicholas, R.J., Aphandéry, E., Topuria, T., Browning, N.D.

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The epitaxial growth of silicon and germanium films on (111) silicon surfaces using UHV sublimation and evaporation techniques von Cullis, A.G., Booker, G.R.

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Nature, origin and effect of dislocations in epitaxial semiconductor layers von Booker, G.R., Titchmarsh, J.M., Fletcher, J., Darby, D.B., Hockly, M., Al-Jassim, M.

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Electrical, Rutherford backscattering and transmission electron microscopy studies of furnace annealed zinc implanted GaAs von Kular, S.S., Sealy, B.J., Stephens, K.G., Sadana, D., Booker, G.R.

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Microstructuural Evolution in SUS304H Steel during Long-Term Creep Over 105 h von Irie, Hiroshi, Tanaka, Hisao, Booker, G.R., Murata, M.

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Creep Characteristics of Precipitation Hardened Carbon Free Martensitic Alloys von Muneki, Seiichi, Igarashi, M., Booker, G.R.

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Electron microscope study of epitaxial silicon films on sapphire and diamond substrates von Cullis, A.G., Booker, G.R.

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Residual polishing damage and surface quality of commercial InP wafers: A scanning PL study von Laczik, Z., Booker, G.R., Mowbray, A.

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Comparison of surface polishing techniques used for InP wafers von Laczik, Z., Booker, G.R., Mowbray, A.

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Assessment of residual subsurface polishing damage in InP wafers by photoluminescence von Laczik, Z., Booker, G.R., Mowbray, A.

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Acceleration of Fe2W Precipitation and Its Effect on Creep Deformation Behavior of 8.5Cr-2W-VNb Steels with Si von Fujitsuna, N., Igarashi, M., Booker, G.R.

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Backscattered electron contrast on cross sections of interfaces and multilayers in the scanning electron microscope von Konkol, A, Booker, G.R, Wilshaw, P.R

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Mechanical Properties of 11Cr-0.4Mo-2W-CuVNb Steel Welded Joints at Elevated Temperatures von Tabuchi, M., Watanabe, T., Kubo, K., Booker, G.R., Kinugawa, J.

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Growth of InAs/GaSb strained layer superlattices. I von Booker, G.R., Klipstein, P.C., Lakrimi, M., Lyapin, S., Mason, N.J., Nicholas, R.J., Seong, T.-Y., Symons, D.M., Vaughan, T.A., Walker, P.J.

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