A Nondestructive Method for Accurately Extracting Substrate Parameters of Arbitrary Doping Profile in Nanoscale VLSI von Bontzios, Y. I., Dimopoulos, M. G., Hatzopoulos, A. A.

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A universal model for calculating capacitive and resistive coupling on lightly and heavily doped CMOS processes von Bontzios, Y I, Hatzopoulos, A

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Automated substrate resistance extraction in nanoscale VLSI by exploiting a geometry-based analytical model von Bontzios, Y. I., Dimopoulos, M. G., Hatzopoulos, A. A.

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Closed-form expressions for the coupling capacitance computation between through silicon vias and interconnects for 3D ICs von Bontzios, Y. I., Dimopoulos, M. G., Hatzopoulos, A. A.

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A memetic algorithm for computing 3D capacitance in multiconductor VLSI circuits von Bontzios, Y I, Dimopoulos, M G, Hatzopoulos, A A

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Exact closed-form expressions for substrate resistance and capacitance extraction in nanoscale VLSI von Bontzios, Y. I., Dimopoulos, M. G., Hatzopoulos, A. A.

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