RESIDUAL STRESS ANALYSIS BY NEUTRON AND X-RAY DIFFRACTION APPLIED TO THE STUDY OF TWO PHASE MATERIALS: METAL MATRIX COMPOSITES von Ceretti, M., Braham, C., Lebrun, J.L., Bonnafe, J.P., Perrin, M., Lodini, A.

Volltext

A study of semiconductor surfaces and devices by coupled IR photon tunneling and atomic-force microscopy von Gall-Borrut, P., Castagne, M., Weyher, J.L., Fillard, J.P., Bonnafe, J.

Volltext

Short range association of EL2 with dislocations in GaAs-In materials von Fillard, J.P., Gall, P., Baroudi, A., Bonnafe, J.

Volltext

Photon tunneling from semiconductor surfaces to atomic force microscopy probes von Fillard, J.P., Castagné, M., Prioleau, C., Baudry, E., Gall, P., Bonnafé, J.

Volltext

High resolution and sensitivity infrared tomography von Fillard, J.P., Montgomery, P.C., Gall, P., Castagné, M., Bonnafé, J.

Volltext

Observation of cellular structures of defects in semi-insulating InP-Fe von Fillard, J.P., Baroudi, A., Gall, P., Bonnafe, J., Favennec, P.N., Coquille, R.

Volltext

Laser Scanning Tomography: A Study of the Defect Cluster Nucleation and Growth in Silicon von Fillard, J.P., Castagne, M., Gall, P., Bonnafe, J.

Volltext

Qualification by optical means of CdTe substrates von Triboulet, R., Durand, A., Gall, P., Bonnafé, J., Fillard, J.P., Krawczyk, S.K.

Volltext

EL2 Quenching Behaviour in Infrared GaAs Transmission Images von Fillard, J.P., Castagne, M., Bonnafe, J., Gall, P.

Volltext

Submicron optical sectioning microscopy: A particular inverse problem solution adapted to epilayer defect analysis von Fillard, J.P., Montgomery, P.C., Gall, P., Bonnafé, J., Castagné, M.

Volltext

An analysis of the oxygen condensation processes in silicon by laser-scanning tomography von Gall, P., Bonnafé, J., Fillard, J.P., Lemme, R., Fazekas, J.

Volltext

EL2 related levels in GaAs-SI: Transmission and dispersion in infra-red imaging von Castagne, M., Fillard, J.P., Bonnafe, J.

Volltext

Photon tunneling from InP material surface von Castagne, M., Prioleau, C., Baudry, E., Fillard, J.P., Bonnafe, J.

Volltext bestellen

Collective investigations on two typical semi-insulating GaAs ingots von Bonnafe, J., Castagne, M., Clerjaud, B., Deveaud, B., Favennec, P.N., Fillard, J.P., Gauneau, M., Goltzene, A., Guenais, B., Guillot, G., Hennel, A.M., Huber, A.M., Jouglar, J., Leyral, P., Manifacier, J.C., Martinez, G., Picoli, G., Roizes, A., Schwab, C., Visentin, N., Vuillermoz, P.L.

Volltext