L-shell radiative transition rates by selective synchrotron ionization von Bonetto, R D, Carreras, A C, Trincavelli, J, Castellano, G

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Texture characterization of digital images which have a periodicity or a quasi-periodicity von Bonetto, R D, Forlerer, E, Ladaga, J L

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Structural modelling of coprecipitated VTiO catalysts von Briand, L.E., Bonetto, R.D., Sanchez, M.A., Thomas, H.J.

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Statistical analysis of a mixed-layer x-ray diffraction peak von Rebollo-Neira, L, Constantinides, A G, Plastino, A, Alvarez, A, Bonetto, R D, Iñiguez-Rodriguez, A M

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The variogram method for characterization of scanning electron microscopy images von Bonetto, R. D., Ladaga, J. L.

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Structural changes on deactivation of ZSM-5. A study by X-ray powder diffraction von Alvarez, A.G., Viturro, H., Bonetto, R.D.

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Thickness determination of electrochemical titanium oxide (Ti/TiO2) formed in HClO4 solutions von Filippin, F.A., Linarez Pérez, O.E., Teijelo, M. López, Bonetto, R.D., Trincavelli, J., Avalle, L.B.

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Thickness determination of electrochemical titanium oxide (Ti/TiO sub(2)) formed in HClO sub(4) solutions von Filippin, F A, Perez, OELinarez, Teijelo, MLopez, Bonetto, R D, Trincavelli, J, Avalle, L B

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FERImage: an interactive program for fractal dimension, d(per) and d(min) calculation von Bianchi, F D, Bonetto, R D

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XTL-SIZE: a computer program for crystal-size-distribution calculation from X-ray diffraction line broadening von Bonetto, R. D., Viturro, H. R., Alvarez, A. G.

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Bulk and surface characterization of crystalline and plastic sulphur oxidized by two Thiobacillus species von Briand, L.E., Bonetto, R.D., Ladaga, J.L., Donati, E.

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Measuring system for obtaining concentration profiles in supported catalysts using electron-probe microanalysis. Influence of standards von Viturro, H., Bonetto, R. D., Pizzio, L. R., Vázquez, P. G., Sanchez, M., Alvarez, A. G.

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Intensity for cubic particles in x-ray fluorescence analysis von Bonetto, R. D., Riveros, J. A.

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Statistical inference and crystallite size distributions von Guérin, D. M. A., Alvarez, A. G., Rebollo Neira, L. E., Plastino, A., Bonetto, R. D.

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FerImage: An interactive program for fractal dimension, dper and dmin calculation von Bianchi, F. D., Bonetto, R. D.

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FerImage: An interactive program for fractal dimension, d per and d min calculation von Bianchi, F. D., Bonetto, R. D.

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A simple backscattered electrons and specimen current detection device for the scanning electron microscope von Viturro, H., Peez, C., Bonetto, R. D., Alvarez, A. G.

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Measuring the dead time of an x-ray spectrometer by means of the first- and second-order reflections method von Bonetto, R. D., Riveros, J. A.

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Deconvolution problems and information theory von Nuñez, J., Rebollo Neira, L. E., Plastino, A., Bonetto, R. D., Guérin, D. M. A., Alvarez, A. G.

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Extension of the Rasberry-Heinrich equation for x-ray fluorescence analysis von Riveros, Jose A, Bonetto, Rita D, Mainardi, Raul T

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