Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects von Copetti, Thiago, Cardoso Medeiros, Guilherme, Taouil, Mottaqiallah, Hamdioui, Said, Bolzani Poehls, Letícia, Balen, Tiago

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Hard-to-Detect Fault Analysis in FinFET SRAMs von Cardoso Medeiros, Guilherme, Fieback, Moritz, Wu, Lizhou, Taouil, Mottaqiallah, Bolzani Poehls, Leticia Maria, Hamdioui, Said

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Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects von Benfica, Juliano, Green, Bruno, Porcher, Bruno C., Bolzani Poehls, Leticia, Vargas, Fabian, Medina, Nilberto H., Added, Nemitala, de Aguiar, Vitor A. P., Macchione, Eduardo L. A., Aguirre, Fernando, Silveira, Marcilei A. G., Perez, Martin, Sofo Haro, Miguel, Sidelnik, Ivan, Blostein, Jeronimo, Lipovetzky, Jose, Bezerra, Eduardo A.

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2021 JETTA-TTTC Best Paper Award: Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, and Tiago Balen, “Evaluation of Single Event Upset Susceptibility of FinFET‑based SRAMs with Weak Resistive Defects,” Journal of Electronic Testing: Theory and Applications, Volume 37, Number 3, pp. 383–394, June 2021

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Modeling of Physical Defects in PN Junction Based Graphene Devices von Miryala, Sandeep, Oleiro, Matheus, Bolzani Pöhls, Letícia Maria, Calimera, Andrea, Macii, Enrico, Poncino, Massimo

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Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits von Jenihhin, Maksim, Squillero, Giovanni, Copetti, Thiago Santos, Tihhomirov, Valentin, Kostin, Sergei, Gaudesi, Marco, Vargas, Fabian, Raik, Jaan, Sonza Reorda, Matteo, Bolzani Poehls, Leticia, Ubar, Raimund, Medeiros, Guilherme Cardoso

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Evaluating the Effects of Combined Total Ionizing Dose Radiation and Electromagnetic Interference von Benfica, Juliano, Bolzani Poehls, Leticia M., Vargas, Fabian, Lipovetzky, José, Lutenberg, Ariel, Garcia, Sebastián E., Gatti, Edmundo, Hernandez, Fernando

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A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation von Benfica, Juliano, Bolzani Poehls, Letícia Maria, Vargas, Fabian, Lipovetzky, José, Lutenberg, Ariel, Gatti, Edmundo, Hernandez, Fernando

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2021 JETTA-TTTC Best Paper Award: Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, and Tiago Balen, “Evaluation of Single Event Upset Susceptibility of FinFET‑based SRAMs with Weak Resistive Defects,” Journal of Electronic Testing: Th

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Configurable platform for SoC combined tests of TID radiation, aging and EMI von Benfica, J., Bolzani Poehls, Leticia, Vargas, Fabian, Lipovetzky, J., Lutenberg, A., Garcia, S. E.

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Investigating the behavior of physical defects in pn-junction based reconfigurable graphene devices von Miryala, Sandeep, Calimera, Andrea, Macii, Enrico, Poncino, Massimo, Bolzani Poehls, Leticia

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A Fully Automated Platform for Evaluating ReRAM Crossbars von Pelke, Rebecca, Staudigl, Felix, Thomas, Niklas, Bosbach, Nils, Hossein, Mohammed, Cubero-Cascante, Jose, Poehls, Leticia Bolzani, Leupers, Rainer, Joseph, Jan Moritz

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A Fully Automated Platform for Evaluating ReRAM Crossbars von Pelke, Rebecca, Staudigl, Felix, Thomas, Niklas, Bosbach, Nils, Mohammed, Hossein, Cubero-Cascante, Jose, Leticia Bolzani Poehls, Leupers, Rainer, Jan Moritz Joseph

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Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC : öffentlicher Schlussbericht für die Technische Informationsbibliothek (TIB) a... von Hoffmann-Eifert, Susanne, Dittmann, Regina, Wuttig, Matthias, Grützmacher, Detlev, Vescan, Andrei, Knoch, Joachim, Lemme, Max Christian, Rana, Vikas, Menzel, Stephan Jan-Martin, Leupers, Rainer, Wiefels, Stefan, Witzleben, Moritz, Bolzani Poehls, Leticia, Wouters, Dirk, Gemmeke, Tobias, Waser, Rainer

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sistema e método de identificação de ameaças e proteção de dados e informações armazenados em dispositivos eletrônicos von LETICIA MARIA BOLZANI POEHLS, FABIAN LUIS VARGAS, LUCAS DA SILVA VIVIAN CORRÊA

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Using an FPGA-based fault injection technique to evaluate software robustness under SEEs: A case study von Portela-Garcia, M., Lindoso, A., Entrena, L., Garcia-Valderas, M., Lopez-Ongil, C., Pianta, B., Poehls, L. B., Vargas, F.

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Configurable platform for IC combined tests of total-ionizing dose radiation and electromagnetic immunity von Benfica, J., Poehls, L. B., Vargas, F., Lipovetzky, J., Lutenberg, A., Garcia, S. E., Gatti, E., Hernandez, F., Calazans, N. L. V.

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Conducted EMI susceptibility analysis of a COTS processor as function of aging von Benfica, Juliano, Vargas, Fabian, Soares, Matheus Fay, Schramm, Dorian

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2021 JETTA-TTTC Best Paper Award

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Editorial von Agrawal, Vishwani D

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