Treffer 1 - 5 von 5 für Suche 'Bolzani Poehls, Letícia Maria', Suchdauer: 0,48s Treffer weiter einschränken
  1. 1
    Hard-to-Detect Fault Analysis in FinFET SRAMs

    Hard-to-Detect Fault Analysis in FinFET SRAMs von Cardoso Medeiros, Guilherme, Fieback, Moritz, Wu, Lizhou, Taouil, Mottaqiallah, Bolzani Poehls, Leticia Maria, Hamdioui, Said


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  2. 2
    A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation

    A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation von Benfica, Juliano, Bolzani Poehls, Letícia Maria, Vargas, Fabian, Lipovetzky, José, Lutenberg, Ariel, Gatti, Edmundo, Hernandez, Fernando

    Veröffentlicht in Journal of electronic testing

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  3. 3
    2021 JETTA-TTTC Best Paper Award: Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, and Tiago Balen, “Evaluation of Single Event Upset Susceptibility of FinFET‑based SRAMs with Weak Resistive Defects,” Journal of Electronic Testing: Theory and Applications, Volume 37, Number 3, pp. 383–394, June 2021

    2021 JETTA-TTTC Best Paper Award: Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, and Tiago Balen, “Evaluation of Single Eve...

    Veröffentlicht in Journal of electronic testing

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  4. 4
    Modeling of Physical Defects in PN Junction Based Graphene Devices

    Modeling of Physical Defects in PN Junction Based Graphene Devices von Miryala, Sandeep, Oleiro, Matheus, Bolzani Pöhls, Letícia Maria, Calimera, Andrea, Macii, Enrico, Poncino, Massimo

    Veröffentlicht in Journal of electronic testing

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  5. 5
    sistema e método de identificação de ameaças e proteção de dados e informações armazenados em dispositivos eletrônicos

    sistema e método de identificação de ameaças e proteção de dados e informações armazenados em dispositivos eletrônicos von LETICIA MARIA BOLZANI POEHLS, FABIAN LUIS VARGAS, LUCAS DA SILVA VIVIAN CORRÊA

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