LeXtender: a software package for advanced MOKE acquisition and analysis von Gräfe, Joachim, Groß, Felix, Ilse, Sven E, Boltje, Daan B, Muralidhar, Shreyas, Goering, Eberhard J

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Reproducible lamella preparation for electron cryo-tomography by in-situ thickness estimation during fluorescence-guided FIB milling von Skoupy, Radim, Boltje, Daan B., Hoogenboom, Jacob P., Jakobi, Arjen J.

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A cryogenic, coincident fluorescence, electron, and ion beam microscope von Boltje, Daan B, Hoogenboom, Jacob P, Jakobi, Arjen J, Jensen, Grant J, Jonker, Caspar T H, Kaag, Max J, Koster, Abraham J, Last, Mart G F, de Agrela Pinto, Cecilia, Plitzko, Jürgen M, Raunser, Stefan, Tacke, Sebastian, Wang, Zhexin, van der Wee, Ernest B, Wepf, Roger, den Hoedt, Sander

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Robust Local Thickness Estimation of Sub‐Micrometer Specimen by 4D‐STEM von Skoupý, Radim, Boltje, Daan B., Slouf, Miroslav, Mrázová, Kateřina, Láznička, Tomáš, Taisne, Clémence M., Krzyžánek, Vladislav, Hoogenboom, Jacob P., Jakobi, Arjen J.

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3D Fluorescence Localization in Frozen Cells for Targeted Lamella Milling for Electron Cryo-Tomography von van der Wee, Ernest B., Boltje, Daan B., Jakobi, Arjen J., Hoogenboom, Jacob P.

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A Cryogenic Fluorescence Microscope Retrofittable in Coincidence with a FIB/SEM von Boltje, Daan B., Hoogenboom, Jacob P., Jakobi, Arjen J., Jensen, Grant J., Jonker, Caspar T.H., Koster, Abraham J., Last, Mart G.F., Plitzko, Jürgen M., Raunser, Stefan, Tacke, Sebastian, Wepf, Roger, den Hoedt, Sander

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Low energy electron microscopy at cryogenic temperatures von Tebyani, Arash, Schramm, Sebastian, Hesselberth, Marcel, Boltje, Daan, Jobst, Johannes, Tromp, Rudolf, van der Molen, Sense Jan

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Fluorescence-guided lamella fabrication with ENZEL, an integrated cryogenic CLEM solution for the cryo-electron tomography workflow von Jonker, Caspar, Boltje, Daan, Hoogenboom, Jacob, Jakobi, Arjen, Jensen, Grant, Koster, Abraham, Last, Mart, Plitzko, Jürgen, Raunser, Stefan, Tacke, Sebastian, Wepf, Roger, Hoedt, Sander Den

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ENZEL - A cryogenic, retrofittable, coincident fluorescence, electron, and ion beam solution for the cryo-electron tomography workflow von Boltje, Daan, Hoogenboom, Jacob, Jakobi, Arjen, Jensen, Grant, Jonker, Caspar, Koster, Abraham, Last, Mart, Plitzko, Jürgen, Raunser, Stefan, Tacke, Sebastian, Wepf, Roger, Hoedt, Sander Den

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Full dataset of the article: Robust local thickness estimation of sub-micrometer specimen by 4D-STEM von Skoupý, Radim, Boltje, Daan

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Full dataset of the article: Robust local thickness estimation of sub-micrometer specimen by 4D-STEM von Skoupý, Radim, Boltje, Daan

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Full dataset of the article: Robust local thickness estimation of sub-micrometer specimen by 4D-STEM von SkoupÃ1⁄2, Radim, Boltje, Daan

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Data underlying the publication: Depth-dependent scaling of axial distances in light microscopy von Boltje, Daan, Loginov, Sergey, Hensgens, Myron, Hoogenboom, Jacob, van der Wee, Ernest

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Data underlying the publication: Depth-dependent scaling of axial distances in light microscopy von Boltje, Daan, Loginov, Sergey, Hensgens, Myron, Hoogenboom, Jacob, van der Wee, Ernest

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METHOD FOR LOCALIZING A REGION OF INTEREST IN A SAMPLE AND MICROMACHINING THE SAMPLE USING A CHARGED PARTICLE BEAM von VAN DER WEE, Ernest Benjamin, BOLTJE, Daan Benjamin, HOOGENBOOM, Jacob Pieter

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METHOD AND APPARATUS FOR IN-SITU SAMPLE QUALITY INSPECTION IN CRYOGENIC FOCUSED ION BEAM MILLING von SKOUPÝ, Radim, JAKOBI, Arjen-Joachim, BOLTJE, Daan Benjamin, HOOGENBOOM, Jacob Pieter

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METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED ION BEAM von SMEETS, Marit Rosa, JONKER, Caspar Theodorus Hugo, ZIELINSKI, Marcin Stefan, BOLTJE, Daan Benjamin, LAST, Mart Guus Ferdinand

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METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED ION BEAM von SMEETS, Marit Rosa, JONKER, Caspar Theodorus Hugo, ZIELINSKI, Marcin Stefan, BOLTJE, Daan Benjamin, LAST, Mart Guus Ferdinand

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METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED ION BEAM von SMEETS, Marit Rosa, JONKER, Caspar Theodorus Hugo, ZIELINSKI, Marcin Stefan, BOLTJE, Daan Benjamin, LAST, Mart Guus Ferdinand

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Data underlying the publication: A cryogenic, coincident fluorescence, electron and ion beam microscope von Boltje, Daan, Hoogenboom, Jacob, Jakobi, Arjen, Jensen, Grant, Jonker, Caspar, Kaag, Max, Koster, Abraham, Last, Mart G. F., de Agrela Pinto, Cecilia, Plitzko, Jürgen, Raunser, Stefan, Tacke, Sebastian, Wang, Zhexin, van der Wee, Ernest, Wepf, Roger, den Hoedt, Sander

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