Failure Analysis of Atmospheric Neutron-Induced Single Event Burnout of a Commercial SiC MOSFET von Niskanen, Kimmo, Germanicus, Rosine Coq, Jouha, Wadia, Latry, Olivier, Touboul, Antoine D., Michez, Alain, Moultif, Niemat, Boch, Jerôme, Lüders, Ulrike

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A New Analytical Approach to Evaluate the Radiation Sensitivity of Circuits Implemented on SRAM-Based FPGAs von Bricas, Gaetan, Tsiligiannis, Georgios, Boch, Jerome, Bricas, Samuel

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Exploring Radiation-Induced Vulnerabilities in RFICs through Traditional RF Metrics von Scialdone, Antonio, Ferraro, Rudy, Dilillo, Luigi, Saigne, Frederic, Boch, Jerome, Masi, Alessandro, Danzeca, Salvatore

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TID Level of Failure Dependence From Operating Configuration of the System-Space Class DC/DC Converter Case Study von Rajkowski, Tomasz, Boch, Jerome, Saigne, Frederic, Wang, Pierre-Xiao, Wronka, Slawomir, Matusiak, Michal, Wasilewski, Adam

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Enhancement of System Observability During System-Level Radiation Testing Through Total Current Consumption Monitoring von Slipukhin, Ivan, Coronetti, Andrea, Alia, Ruben Garcia, Saigne, Frederic, Boch, Jerome, Dilillo, Luigi, Aguiar, Ygor Q., Cazzaniga, Carlo, Kastriotou, Maria, Dodd, Torran

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Comparison of High Energy X-Ray and Cobalt-60 Irradiations on MOS Capacitors von Girones, Vincent, Boch, Jerome, Saigne, Frederic, Carapelle, Alain, Chapon, Arnaud, Maraine, Tadec, Garcia Alia, Ruben

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The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices von Girones, Vincent, Boch, Jerome, Carapelle, Alain, Chapon, Arnaud, Maraine, Tadec, Labau, Timothee, Saigne, Frederic, Alia, Ruben Garcia

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Toward an Embedded and Distributed Optical Fiber-Based Dosimeter for Space Applications von Meyer, Arnaud, Morana, Adriana, Weninger, Luca, Balcon, Nicolas, Melin, Gilles, Mekki, Julien, Robin, Thierry, Champavere, Andre, Saigne, Frederic, Boch, Jerome, Maraine, Tadec, Ait-Ali-Said, Aomer, Marin, Emmanuel, Ouerdane, Youcef, Boukenter, Aziz, Girard, Sylvain

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A Methodology to Estimate Single-Event Effects Induced by Low-Energy Protons von Marques, Cleiton, Wrobel, Frédéric, Aguiar, Ygor, Michez, Alain, Boch, Jérôme, Saigné, Frédéric, García Alía, Rubén

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Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells von Marques, Cleiton M., Wrobel, Frédéric, Aguiar, Ygor Q., Michez, Alain, Saigné, Frédéric, Boch, Jérôme, Dilillo, Luigi, García Alía, Rubén

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An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons von Wrobel, Frédéric, Aguiar, Ygor, Marques, Cleiton, Lerner, Giuseppe, García Alía, Rubén, Saigné, Frédéric, Boch, Jérôme

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Neutrons-Induced IGBT Failure: Effects of the Number of Tested Devices on the Cross Section Calculation von Touboul, Antoine D., Foro, Lionel L., Wrobel, Frederic, Guetarni, Karima, Boch, Jerome, Saigne, Frederic

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Comparison of the Total Ionizing Dose Sensitivity of a System in Package Point of Load Converter Using Both Component- and System-Level Test Approaches von Rajkowski, Tomasz, Saigné, Frédéric, Niskanen, Kimmo, Boch, Jérôme, Maraine, Tadec, Kohler, Pierre, Dubus, Patrick, Touboul, Antoine, Wang, Pierre-Xiao

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Impact of Switched Dose-Rate Irradiation on the Response of the LM124 Operational Amplifier to Pulsed X-Rays von Roche, N J.-H, Dusseau, L, Mekki, J, Perez, S, Vaille, J.-R, Gonzalez Velo, Yago, Boch, J, Saigne, F, Marec, R, Calvel, P, Bezerra, F, Auriel, G, Azais, B, Buchner, S P

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Monte Carlo simulation of particle-induced bit upsets von Wrobel, Frédéric, Touboul, Antoine, Vaillé, Jean-Roch, Boch, Jérôme, Saigné, Frédéric

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Bias Effects on Total Dose-Induced Degradation of Bipolar Linear Microcircuits for Switched Dose-Rate Irradiation von Velo, Y Gonzalez, Boch, Jérôme, Roche, Nicolas Jean-Henri, Perez, Stephanie, Vaille, Jean-Roch, Dusseau, Laurent, Saigne, Frédéric, Lorfevre, Eric, Schrimpf, Ronald D, Chatry, Christian, Canals, Anna

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Study of Synergism Effect Between TID and ATREE on the Response of the LM124 Operational Amplifier von Roche, N. J.-H, Perez, S., Mekki, J., Velo, Y. G., Dusseau, L., Boch, J., Vaille, J.-R, Saigne, F., Marec, R., Calvel, P., Bezerra, F., Auriel, G., Azais, B., Buchner, S. P.

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The Use of a Dose-Rate Switching Technique to Characterize Bipolar Devices von Boch, J., Gonzalez Velo, Y., Saigne, F., Roche, N.J.-H., Schrimpf, R.D., Vaille, J.-R., Dusseau, L., Chatry, C., Lorfevre, E., Ecoffet, R., Touboul, A.D.

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Evaluation of ELDRS Mechanisms Using Dose Rate Switching Experiments on Gated Lateral PNP Transistors von Gonzalez-Velo, Y., Boch, J., Saigne, F., Roche, N. J., Perez, S., Vaille, J., Deneau, C., Dusseau, L., Lorfevre, E., Schrimpf, R. D., Chatry, C., Legoulven, E., Platteter, D. G.

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Correlation of Dynamic Parameter Modification and ASET Sensitivity in a Shunt Voltage Reference von Roche, Nicolas J.-H., Buchner, Stephen. P., Dusseau, Laurent, Kruckmeyer, Kurby, Boch, Jérome, Warner, Jeffrey H., Saigne, Frédéric, McMorrow, Dale, Auriel, Gérard, Azais, Bruno

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