Enhancing CMOS Using Nanoelectronic Devices: A Perspective on Hybrid Integrated Systems von Ricketts, David S., Bain, James A., Luo, Yi, Blanton, Ronald DeShawn, Mai, Kenneth, Fedder, Gary K.

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Partial Bayesian Co-training for Virtual Metrology von Nguyen, Cuong Manh, Li, Xin, Blanton, Ronald DeShawn, Li, Xiang

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Diagnosis of Integrated Circuits With Multiple Defects of Arbitrary Characteristics von Xiaochun Yu, Blanton, Ronald DeShawn

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Diagnosis-Assisted Adaptive Test von Xiaochun Yu, Blanton, R. D.

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Enhancing CMOS Using Nanoelectronic Devices: A Perspective on Hybrid Integrated Systems: NANOELECTRONICS RESEARCH FOR BEYOND CMOS INFORMATION PROCESSING von RICKETTS, David S, BAIN, James A, YI LUO, DESHAWN BLANTON, Ronald, MAI, Kenneth, FEDDER, Gary K

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Accurate Coupling-centric Timing Analysis Incorporating Temporal and Functional Isolation von Arunachalam, Ravishankar, Blanton, Ronald DeShawn, Pileggi, Lawrence T.

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Methods and systems for achieving system-level counterfeit protection in integrated chips von Blanton, Ronald DeShawn, Niewenhuis, Benjamin

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Methods and Systems for Achieving System-Level Counterfeit Protection in Integrated Chips von BLANTON RONALD DESHAWN

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Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations von Blanton, R. D., Tam, W. C., Xiaochun Yu, Nelson, J. E., Poku, O.

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Method and system for systematic defect identification von BLANTON RONALD DESHAWN, TAM WING CHIU

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METHOD AND SYSTEM FOR SYSTEMATIC DEFECT IDENTIFICATION von BLANTON RONALD DESHAWN, TAM WING CHIU

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Methods for characterizing, generating test sequences for, and/or simulating integrated circuit faults using fault tuples and related systems and computer program products von Blanton, Ronald DeShawn

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Methods for characterizing, generating test sequences for, and/or simulating integrated circuit faults using fault tuples and related systems and computer program products von BLANTON RONALD DESHAWN

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Built-in self test of MEMS von Deb, Nilmoni, Blanton, Ronald DeShawn

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Built-in self test of MEMS von DEB NILMONI, BLANTON RONALD DESHAWN

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Methods for characterizing, generating test sequences for, and/or simulating integrated circuit faults using fault tuples and related systems and computer program products von BLANTON RONALD DESHAWN

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Using neighborhood functions to extract logical models of physical failures using layout based diagnosis von Blanton, Ronald DeShawn, Desineni, Rao H, Maly, Wojciech

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Using neighborhood functions to extract logical models of physical failures using layout based diagnosis von DESINENI RAO H, BLANTON RONALD DESHAWN, MALY WOJCIECH

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BUILT-IN SELF TEST OF MEMS von DEB, NILMONI, BLANTON, RONALD, DESHAWN

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BUILT-IN SELF TEST OF MEMS von NILMONI DEB, RONALD, DESHAWN BLANTON

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