Microfabricated thermal conductivity detector for the micro-ChemLab von Cruz, D., Chang, J.P., Showalter, S.K., Gelbard, F., Manginell, R.P., Blain, M.G.

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Mechanism of nitrogen removal from silicon nitride by nitric oxide von Blain, M. G.

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Impact of slow gold clusters on various solids: nonlinear effects in secondary ion emission von Benguerba, M., Brunelle, A., Della-Negra, S., Depauw, J., Joret, H., Le Beyec, Y., Blain, M.G., Schweikert, E.A., Assayag, G.Ben, Sudraud, P.

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Absolute intensities of the vacuum ultraviolet spectra in a metal-etch plasma processing discharge von Woodworth, J. R., Blain, M. G., Jarecki, R. L., Hamilton, T. W., Aragon, B. P.

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Surface dependent electron and negative ion density in inductively coupled discharges von Hebner, G. A., Blain, M. G., Hamilton, T. W., Nichols, C. A., Jarecki, R. L.

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Influence of surface material on the boron chloride density in inductively coupled discharges von Hebner, G. A., Blain, M. G., Hamilton, T. W.

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SOI-enabled MEMS processes lead to novel mechanical, optical, and atomic physics devices von Herrera, G.V., Bauer, T., Blain, M.G., Dodd, P.E., Dondero, R., Garcia, E.J., Galambos, P.C., Hetherington, D.L., Hudgens, J.J., McCormick, F.B., Nielson, G.N., Nordquist, C.D., Okandan, M., Olsson, R.H., Platzbecker, M.R., Resnick, P.J., Shul, R.J., Shaw, M.J., Sullivan, C.T., Watts, M.R.

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Surface characterization with keV clusters and MeV ions von Schweikert, E.A., Blain, M.G., Park, M.A., Da Silveira, E.F.

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Gamma ray burst studies with THESEUS von Ghirlanda, G., Salvaterra, R., Toffano, M., Ronchini, S., Guidorzi, C., Oganesyan, G., Ascenzi, S., Bernardini, M. G., Camisasca, A. E., Mereghetti, S., Nava, L., Ravasio, M. E., Branchesi, M., Castro-Tirado, A., Amati, L., Blain, A., Bozzo, E., O’Brien, P., Götz, D., Le Floch, E., Osborne, J. P., Rosati, P., Stratta, G., Tanvir, N., Bogomazov, A. I., D’Avanzo, P., Hafizi, M., Mandhai, S., Melandri, A., Peer, A., Topinka, M., Vergani, S. D., Zane, S.

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