Characterization of ferroelectric domains in magnetite (Fe3O4) von Seddon, S. D., Cooper, A., Fricke, T., Ebbinghaus, S. G., Walker, M., Hase, T. P. A., Blackmore, W. J. A., Alexe, M.

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Determining the anisotropy and exchange parameters of polycrystalline spin-1 magnets von Blackmore, W J A, Brambleby, J, Lancaster, T, Clark, S J, Johnson, R D, Singleton, J, Ozarowski, A, Schlueter, J A, Chen, Y-S, Arif, A M, Lapidus, S, Xiao, F, Williams, R C, Blundell, S J, Pearce, M J, Lees, M R, Manuel, P, Villa, D Y, Villa, J A, Manson, J L, Goddard, P A

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Radiation Effects on Ytterbium- and Ytterbium/Erbium-Doped Double-Clad Optical Fibers von Girard, S., Ouerdane, Y., Tortech, B., Marcandella, C., Robin, T., Cadier, B., Baggio, J., Paillet, P., Ferlet-Cavrois, V., Boukenter, A., Meunier, J.-P., Schwank, J.R., Shaneyfelt, M.R., Dodd, P.E., Blackmore, E.W.

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Magnetic order and disorder in a quasi-two-dimensional quantum Heisenberg antiferromagnet with randomized exchange von Xiao, F., Blackmore, W. J. A., Huddart, B. M., Gomilšek, M., Hicken, T. J., Baines, C., Baker, P. J., Pratt, F. L., Blundell, S. J., Lu, H., Singleton, J., Gawryluk, D., Turnbull, M. M., Krämer, K. W., Goddard, P. A., Lancaster, T.

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Proton- and Gamma-Induced Effects on Erbium-Doped Optical Fibers von Girard, S., Tortech, B., Regnier, E., Van Uffelen, M., Gusarov, A., Ouerdane, Y., Baggio, J., Paillet, P., Ferlet-Cavrois, V., Boukenter, A., Meunier, J.-P., Berghmans, F., Schwank, J.R., Shaneyfelt, M.R., Felix, J.A., Blackmore, E.W., Thienpont, H.

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The capillary channel flow experiments on the International Space Station: experiment set-up and first results von Canfield, P. J., Bronowicki, P. M., Chen, Y., Kiewidt, L., Grah, A., Klatte, J., Jenson, R., Blackmore, W., Weislogel, M. M., Dreyer, M. E.

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Proton-Induced Upsets in 41-nm NAND Floating Gate Cells von Gerardin, S., Bagatin, M., Paccagnella, A., Schwank, J. R., Shaneyfelt, M. R., Blackmore, E. W.

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Hardness Assurance Testing for Proton Direct Ionization Effects von Schwank, J. R., Shaneyfelt, M. R., Ferlet-Cavrois, V., Dodd, P. E., Blackmore, E. W., Pellish, J. A., Rodbell, K. P., Heidel, D. F., Marshall, P. W., LaBel, K. A., Gouker, P. M., Tam, N., Wong, R., Shi-Jie Wen, Reed, R. A., Dalton, S. M., Swanson, S. E.

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The Effect of High-Z Materials on Proton-Induced Charge Collection von Clemens, M A, Hooten, N C, Ramachandran, V, Dodds, N A, Weller, R A, Mendenhall, M H, Reed, R A, Dodd, P E, Shaneyfelt, M R, Schwank, J R, Blackmore, E W

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LET spectra of proton energy levels from 50 to 500 MeV and their effectiveness for single event effects characterization of microelectronics von Hiemstra, D.M., Blackmore, E.W.

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Radiation Effects in 3D Integrated SOI SRAM Circuits von Gouker, P. M., Tyrrell, B., D'Onofrio, R., Wyatt, P., Soares, T., Weilin Hu, Chenson Chen, Schwank, J. R., Shaneyfelt, M. R., Blackmore, E. W., Delikat, K., Nelson, M., McMarr, P., Hughes, H., Ahlbin, J. R., Weeden-Wright, S., Schrimpf, R.

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FLUKA Monte Carlo assessment of the terrestrial muon flux at low energies and comparison against experimental measurements von Infantino, Angelo, Blackmore, Ewart W., Brugger, Markus, Alía, Rubén García, Stukel, Matthew, Trinczek, Michael

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The Contribution of Low-Energy Protons to the Total On-Orbit SEU Rate von Dodds, N. A., Martinez, M. J., Dodd, P. E., Shaneyfelt, M. R., Sexton, F. W., Black, J. D., Lee, D. S., Swanson, S. E., Bhuva, B. L., Warren, K. M., Reed, R. A., Trippe, J., Sierawski, B. D., Weller, R. A., Mahatme, N., Gaspard, N. J., Assis, T., Austin, R., Weeden-Wright, S. L., Massengill, L. W., Swift, G., Wirthlin, M., Cannon, M., Liu, R., Chen, L., Kelly, A. T., Marshall, P. W., Trinczek, M., Blackmore, E. W., Wen, S.-J, Wong, R., Narasimham, B., Pellish, J. A., Puchner, H.

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Comparison of charge yield in MOS devices for different radiation sources von Paillet, P., Schwank, J.R., Shaneyfelt, M.R., Ferlet-Cavrois, V., Jones, R.L., Flarrient, O., Blackmore, E.W.

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Muon-Induced Single Event Upsets in Deep-Submicron Technology von Sierawski, Brian D, Mendenhall, Marcus H, Reed, Robert A, Clemens, Michael A, Weller, Robert A, Schrimpf, Ronald D, Blackmore, Ewart W, Trinczek, Michael, Hitti, Bassam, Pellish, Jonathan A, Baumann, Robert C, Shi-Jie Wen, Wong, Rick, Tam, Nelson

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Hardness Assurance for Proton Direct Ionization-Induced SEEs Using a High-Energy Proton Beam von Dodds, N. A., Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E., Doyle, B. L., Trinczek, M., Blackmore, E. W., Rodbell, K. P., Gordon, M. S., Reed, R. A., Pellish, J. A., LaBel, K. A., Marshall, P. W., Swanson, S. E., Vizkelethy, G., Van Deusen, S., Sexton, F. W., Martinez, M. J.

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Terrestrial Muon Flux Measurement at Low Energies for Soft Error Studies von Blackmore, Ewart W., Stukel, Matthew, Trinczek, Michael, Slayman, Charles, Shi-Jie Wen, Wong, Richard

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SEL Cross Section Energy Dependence Impact on the High Energy Accelerator Failure Rate von Alia, Ruben Garcia, Blackmore, Ewart W., Brugger, Markus, Danzeca, Salvatore, Ferlet-Cavrois, Veronique, Gaillard, Remi, Mekki, Julien, Poivey, Christian, Roed, Ketil, Saigne, Frederic, Spiezia, Giovanni, Trinczek, Michael, Uznanski, Slawosz, Wrobel, Frederic

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GaAs Displacement Damage Dosimeter Based on Diode Dark Currents von Warner, Jeffrey H., Messenger, Scott R., Cress, Cory D., Walters, Robert J., Roche, Nicolas J.-H, Clark, Kenneth A., Bennett, Mitchell F., Blackmore, Ewart W., Trinczek, Michael

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Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation-Implications for Digital SETs von Ferlet-Cavrois, V., Paillet, P., Gaillardin, M., Lambert, D., Baggio, J., Schwank, J.R., Vizkelethy, G., Shaneyfelt, M.R., Hirose, K., Blackmore, E.W., Faynot, O., Jahan, C., Tosti, L.

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