Two-point diameter calibration of a sphere using a micro-coordinate measuring machine at NMIJ von Kondo, Yohan, Hirai, Akiko, Youichi, Bitou

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Scanning deflectometric profiler for measurement of transparent parallel plates von Bitou, Youichi, Kondo, Yohan

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Displacement metrology directly linked to a time standard using an optical-frequency-comb generator von BITOU, Youichi

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Precise measurement of the thickness of silicon wafers by double-sided interferometer and bilateral comparison von Hirai, Akiko, Bitou, Youichi, Bae, Jaeseok, Park, Jungjae, Jin, Jonghan

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High-accuracy displacement metrology and control using a dual Fabry-Perot cavity with an optical frequency comb generator von Bitou, Youichi

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In-situ measurement of mirror deformation using dual Fabry–Pérot cavities for optical pressure standard von Takei, Yoshinori, Telada, Souichi, Yoshida, Hajime, Arai, Kenta, Bitou, Youichi, Kobata, Tokihiko

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Evaluation of the deformation value of an optical flat under gravity von Kondo, Yohan, Bitou, Youichi

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Accurate and wide-range radius of curvature measurement directly linked to a time standard using a Fabry–Pérot cavity von Bitou, Youichi, Takei, Yoshinori, Telada, Souichi

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Round robin comparison study on the form measurement of optical freeform surfaces von Fortmeier, Ines, Schachtschneider, Reyko, Ledl, Vit, Matousek, Ondrej, Siepmann, Jens, Harsch, Antonia, Beisswanger, Rolf, Bitou, Youichi, Kondo, Yohan, Schulz, Michael, Elster, Clemens

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High-lateral-resolution scanning deflectometric profiler using a commercially available autocollimator von Bitou, Youichi, Kondo, Yohan

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Challenges of an optical pressure standard in medium vacuum measurements von Takei, Yoshinori, Telada, Souichi, Yoshida, Hajime, Bitou, Youichi, Kobata, Tokihiko

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Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level von Arezki, Yassir, Su, Rong, Heikkinen, Ville, Leprete, Francois, Posta, Pavel, Bitou, Youichi, Schober, Christian, Mehdi-Souzani, Charyar, Alzahrani, Bandar Abdulrahman Mohammed, Zhang, Xiangchao, Kondo, Yohan, Pruss, Christof, Ledl, Vit, Anwer, Nabil, Bouazizi, Mohamed Lamjed, Leach, Richard, Nouira, Hichem

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Towards medium vacuum measurements using an optical pressure standard von Takei, Yoshinori, Telada, Souichi, Yoshida, Hajime, Bitou, Youichi, Kobata, Tokihiko

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High-precision, low-coherence Fizeau interferometer using a pulsed laser diode for measurement of transparent plates von Bitou, Youichi, Ueki, Nobuaki

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Three-spherical-mirror test for radius of curvature measurement using a Fabry-Pérot cavity von Bitou, Youichi, Sato, Osamu, Telada, Souichi

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Novel analysis of alignment error on spherical Fizeau interferometer and uncertainty evaluation of sphericity calibration system based on random ball test von Kawashima, Natsumi, Kondo, Yohan, Hirai, Akiko, Bitou, Youichi

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Phase-shifting interferometry with feedback control using heterodyne phase detection von BITOU, Youichi

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Development of an optical pressure measurement system using an external cavity diode laser with a wide tunable frequency range von Takei, Yoshinori, Arai, Kenta, Yoshida, Hajime, Bitou, Youichi, Telada, Souichi, Kobata, Tokihiko

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Evaluation of long-term stability of low thermal expansion coefficient materials using gauge block interferometers von Hirai, Akiko, Bitou, Youichi, Oike, Yoshiyuki

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Accurate wide-range displacement measurement using tunable diode laser and optical frequency comb generator von Bitou, Youichi, Schibli, Thomas R., Minoshima, Kaoru

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