Techniques and Applications of Electron Probe Microanalysis von BIRKS, L.S.

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P. Grivet: electron optics von Birks, L.S.

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P. Grivet: electron optics: translated by P.W. Hawkes, revised by A. Septier; 2nd english edition, 870 pages, Pergamon Press, Oxford and New York (1972) von Birks, L.S.

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Pinpointing airborne pollutants von Birks, L. S

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Convex Curved Crystal X‐Ray Spectrograph von Birks, L. S.

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Trace analysis: Physical methods: edited by George H. Morrison. 582 pages, diagrams, illustr., 6 × 9 in. New York, John Wiley & Sons, 1965. Price, $16.00 von Birks, L.S., Walter, D.I.

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Calculation of X-Ray Intensities from Electron Probe Specimens von Birks, L. S.

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Apparatus for X‐Ray Diffraction Studies of Metals under Controlled Stress at Elevated Temperature von Birks, L. S.

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Elevated temperature diffusion in the systems Nb-Pt, Nb-Se, Nb-Zn, Nb-Co, Ni-Ta, and Fe-Mo von Seebold, R.E., Birks, L.S.

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Hafnium-Zirconium and Tantalum-Columbium Systems. Quantitative Analysis by X-Ray Fluorescence von Birks, L. S, Brooks, E. J

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Analysis of Uranium Solutions by X-Ray Fluorescence von Birks, L. S, Brooks, E. J

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X-Ray Yield and Line/Background Ratios for Electron Excitation von Birks, L. S., Seebold, R. E., Grant, B. K., Grosso, J. S.

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