Control of localized access to circuitry through the backside using focused ion beam technology von Antoniou, Nicholas, Thompson, Mark, Salen, Jesse, Casey, David, Goruganthu, Rama R., Ring, Rose, Birdsley, Jeff, Gilfeather, Glen

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Controlled silicon thinning for design debug of C4 packaged ICs von Goruganthu, R.R., Bruce, M., Birdsley, J., Bruce, V., Gilfeather, G., Ring, R., Antoniou, N., Salen, J., Thompson, M.

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