Stability of Ni-based bulk metallic glasses von Tokarz, Michelle L., Speakman, Scott A., Porter, Wallace D., Bilello, John C.

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Structure and properties of Ni60(Nb100-xTax)34Sn6 bulk metallic glass alloys von CHOI-YIM, Haein, TOKARZ, Michelle, BILELLO, John C, JOHNSON, William L

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Structural characterization of Ni-based refractory glassy metals von Tokarz, Michelle L., Bilello, John C.

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Stresses in Multilayered Thin Films von Cammarata, Robert C., Bilello, John C., Greer, A. Lindsay, Sieradzki, Karl, Yalisove, Steven M.

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A study of Ni-based refractory alloys via anomalous scattering techniques von Tokarz, Michelle L., Bilello, John C.

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Stability of Ni-bsed bulk metallic glasses von Tokarz, Michelle L, Speakman, Scott A, Porter, Wallace D, Bilello, John C

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Structure and properties of Ni 60(Nb 100− x Ta x ) 34Sn 6 bulk metallic glass alloys von Choi-Yim, Haein, Tokarz, Michelle, Bilello, John C., Johnson, William L.

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Fabrication of high-performance coatings systems via a novel in-situ/ex-situ characterization technique von Bilello, John C

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PROCESS FOR APPLYING AMORPHOUS METAL von BILELLO JOHN C

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AMORPHOUS METAL FILM AND PROCESS FOR APPLYING SAME von BILELLO, JOHN C

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AMORPHOUS METAL FILM AND PROCESS FOR APPLYING SAME von BILELLO JOHN C

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Temperature dependence of micro-yielding and the transition to macro-strain for tungsten von Bilello, John C.

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AMORPHOUS METAL FILM AND PROCESS FOR APPLYING SAME von BILELLO, JOHN, C

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AMORPHOUS METAL FILM AND PROCESS FOR APPLYING SAME von BILELLO, JOHN C

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AMORPHOUS METAL FILM AND PROCESS FOR APPLYING SAME von BILELLO, JOHN, C

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AMORPHOUS METAL FILM AND PROCESS FOR APPLYING SAME von BILELLO, JOHN C

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Fabrication of High-Performance Coatings Systems via a Novel In-Situ/Ex-Situ Characterization Technique von Bilello, John C

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A simple concept shutter for high energy X-ray beams von Moini, Hossein, Kuo, Chang-Lin, Bilello, John C.

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Non-Destructive Evaluation of Residual Stresses in Thin Films via X-Ray Diffraction Topography Methods von Bilello, John C

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Motor control and data‐acquisition system: Automatic control of x‐ray cameras von Starke, Martin M., Corcoran, Daniel W., Bilello, John C.

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