Physical vapor deposition route for production of Al–Cu–Fe–Cr and Al–Cu–Fe quasicrystalline and approximant coatings von Daniels, M.J., King, D., Fehrenbacher, L., Zabinski, J.S., Bilello, J.C.

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Determination of residual stress in thin films: a comparative study of X-ray topography versus laser curvature method von Zhao, Z.B, Hershberger, J, Yalisove, S.M, Bilello, J.C

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Analysis of thin film stress measurement techniques von Malhotra, S.G, Rek, Z.U, Yalisove, S.M, Bilello, J.C

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In-situ observations of stress-induced thin film failures von Zhao, Z.B., Hershberger, J., Bilello, J.C.

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Structural characterization of Ni-based refractory glassy metals von Tokarz, M.L., Bilello, J.C.

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A Study of Ni-Based Refractory Alloys Via Anomalous Scattering Techniques von Tokarz, M.L., Bilello, J.C., /Michigan U.

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Nanostructured chromium nitride films with a valley of residual stress von Zhao, Z.B., Rek, Z.U., Yalisove, S.M., Bilello, J.C.

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Phase formation and structure of magnetron sputtered chromium nitride films: in-situ and ex-situ studies von Zhao, Z.B, Rek, Z.U, Yalisove, S.M, Bilello, J.C

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In situ observations of the real-time stress-evolution and delamination of thin Ta films on Si(100) von French, B.L, Bilello, J.C

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Structure And Properties of Ni(60)((Nb(100-X)Ta(X))(34) Sn(6) Bulk Metallic Glass Alloys von Choi-Yim, H., Tokarz, M., Bilello, J.C., Johnson, W.L.

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Stress anisotropy and stress gradient in magnetron sputtered films with different deposition geometries von Zhao, Z. B., Yalisove, S. M., Bilello, J. C.

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Development of microstructure in Tl-2212 thin films and possible influence on microwave surface resistance values von Speller, S.C., Wu, H., Rek, Z.U., Bilello, J.C., Grovenor, C.R.M.

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Nature of the as-deposited state of AlCuFeCr PVD coatings von Daniels, M.J., King, D., Phillips, B., Zabinski, J.S., Bilello, J.C.

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Development of Microstructure in T1-2212 Thin Films And Possible Influence on Microwave Surface Resistance Values von Speller, S.C., Wu, H., /Oxford U., Rek, Z.U., /SLAC, SSRL, Bilello, J.C., /Michigan U., Grovenor, C.R.M.

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Microstructure and Chemistry of Annealed Al–Cu–Fe–Cr Quasicrystalline Approximant Coatings von Daniels, M.J., Zabinski, J.S., Wu, H., Grovenor, C.R.M., Bilello, J.C.

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The role of impurities and microstructure on residual stress in nanoscale Mo films von Kendig, L.P, Rek, Z.U, Yalisove, S.M, Bilello, J.C

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Microstructure Development and Tribological Behavior in AlCuFe Quasicrystalline Thin Films von Fehrenbacher, L., Zabinski, J.S., Phillips, B.S., Daniels, M.J., King, D., Ketola, K.S., Bilello, J.C.

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In situ x-ray diffraction observation of multiple texture turnovers in sputtered Cr films von Zhao, Z. B., Rek, Z. U., Yalisove, S. M., Bilello, J. C.

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Growth and characterization of [formula omitted] multiscalar multilayer composite films von Malhotra, A.K, Yalisove, S.M, Bilello, J.C

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Microstructure and residual stress of very thin Mo films von Adams, D.P., Parfitt, L.J., Bilello, J.C., Yalisove, S.M., Rek, Z.U.

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