At-wavelength metrology of hard X-ray mirror using near field speckle von Berujon, Sebastien, Wang, Hongchang, Alcock, Simon, Sawhney, Kawal

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X-ray pulse wavefront metrology using speckle tracking von Berujon, Sebastien, Ziegler, Eric, Cloetens, Peter

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Grating-based at-wavelength metrology of hard x-ray reflective optics von Berujon, Sebastien, Ziegler, Eric

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X-ray Phase Contrast osteo-articular imaging: a pilot study on cadaveric human hands von Rougé-Labriet, Hélène, Berujon, Sebastien, Mathieu, Hervé, Bohic, Sylvain, Fayard, Barbara, Ravey, Jean-Noel, Robert, Yohann, Gaudin, Philippe, Brun, Emmanuel

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Wavefront sensing at X‐ray free‐electron lasers von Seaberg, Matthew, Cojocaru, Ruxandra, Berujon, Sebastien, Ziegler, Eric, Jaggi, Andreas, Krempasky, Juraj, Seiboth, Frank, Aquila, Andrew, Liu, Yanwei, Sakdinawat, Anne, Lee, Hae Ja, Flechsig, Uwe, Patthey, Luc, Koch, Frieder, Seniutinas, Gediminas, David, Christian, Zhu, Diling, Mikeš, Ladislav, Makita, Mikako, Koyama, Takahisa, Mancuso, Adrian P., Chapman, Henry N., Vagovič, Patrik

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Fast optimization of a bimorph mirror using x-ray grating interferometry von Wang, Hongchang, Sawhney, Kawal, Berujon, Sebastien, Sutter, John, Alcock, Simon G, Wagner, Ulrich, Rau, Christoph

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X-ray wavefront characterization of a Fresnel zone plate using a two-dimensional grating interferometer von Wang, Hongchang, Berujon, Sebastien, Pape, Ian, Rutishauser, Simon, David, Christian, Sawhney, Kawal

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At-wavelength metrology using the moiré fringe analysis method based on a two dimensional grating interferometer von Wang, Hongchang, Berujon, Sebastien, Pape, Ian, Rutishauser, Simon, David, Christian, Sawhney, Kawal

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X-ray wavefront characterization using a rotating shearing interferometer technique von Wang, Hongchang, Sawhney, Kawal, Berujon, Sébastien, Ziegler, Eric, Rutishauser, Simon, David, Christian

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X‐ray optics and beam characterization using random modulation: experiments von Berujon, Sebastien, Cojocaru, Ruxandra, Piault, Pierre, Celestre, Rafael, Roth, Thomas, Barrett, Raymond, Ziegler, Eric

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X‐ray optics and beam characterization using random modulation: theory von Berujon, Sebastien, Cojocaru, Ruxandra, Piault, Pierre, Celestre, Rafael, Roth, Thomas, Barrett, Raymond, Ziegler, Eric

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Comparison of X-ray speckle-based imaging deflection retrieval algorithms for the optimization of radiation dose von Rouge-Labriet, Helene, Quenot, Laurene, Bohic, Sylvain, Fayard, Barbara, Paganin, David, Brun, Emmanuel, Berujon, Sebastien

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Modelling phase imperfections in compound refractive lenses von Celestre, Rafael, Berujon, Sebastien, Roth, Thomas, Sanchez del Rio, Manuel, Barrett, Raymond

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Implicit tracking approach for X-ray phase-contrast imaging with a random mask and a conventional system von Quenot, Laurene, Rouge-Labriet, Helene, Bohic, Sylvain, Berujon, Sebastien, Brun, Emmanuel

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Comparison of X-ray speckle-based imaging deflection retrieval algorithms for the optimization of radiation dose von Rouge-Labriet, Helene, Quenot, Laurene, Bohic, Sylvain, Fayard, Barbara, Paganin, David M., Brun, Emmanuel, Berujon, Sebastien

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X-ray multi-modal intrinsic-speckle-tracking von Pavlov, Konstantin M, Paganin, David M, (Thomas) Li, Heyang, Berujon, Sebastien, Rougé-Labriet, Hélène, Brun, Emmanuel

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X-ray phase contrast tomography by tracking near field speckle von Wang, Hongchang, Berujon, Sebastien, Herzen, Julia, Atwood, Robert, Laundy, David, Hipp, Alexander, Sawhney, Kawal

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X-ray phase microscopy using the speckle tracking technique von Berujon, Sebastien, Wang, Hongchang, Pape, Ian, Sawhney, Kawal

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Characterisation of a novel super-polished bimorph mirror von Sawhney, Kawal, Alcock, Simon, Sutter, John, Berujon, Sebastien, Wang, Hongchang, Signorato, Riccardo

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Development of at-wavelength metrology using grating-based shearing interferometry at Diamond Light Source von Wang, Hongchang, Berujon, Sebastien, Sawhney, Kawal

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