SiC power diodes provide breakthrough performance for a wide range of applications von Hefner, A.R., Singh, R., Jih-Sheg Lai, Berning, D.W., Bouche, S., Chapuy, C.

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Physics-based modeling and characterization for silicon carbide power diodes von McNutt, Ty R., Hefner, Allen R., Mantooth, H. Alan, Duliere, Jeff L., Berning, David W., Singh, Ranbir

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High-Voltage Isolated Gate Drive Circuit for 10 kV, 100 A SiC MOSFET/JBS Power Modules von Berning, D.W., Duong, T.H., Ortiz-Rodriguez, J.M., Rivera-Lopez, A., Hefner, A.R.

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A monolithic CMOS microhotplate-based gas sensor system von Afridi, M.Y., Suehle, J.S., Zaghloul, M.E., Berning, D.W., Hefner, A.R., Cavicchi, R.E., Semancik, S., Montgomery, C.B., Taylor, C.J.

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Silicon carbide PiN and merged PiN Schottky power diode models implemented in the Saber circuit simulator von McNutt, T.R., Hefner, A.R., Mantooth, H.A., Duliere, J., Berning, D.W., Singh, R.

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Characteristics and utilization of a new class of low on-resistance MOS-gated power device von Jih-Sheng Lai, Byeng-Mun Song, Rui Zhou, Hefner, A., Berning, D.W., Chih-Chieh Shen

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IGBT model validation for soft-switching applications von Berning, D.W., Hefner, A.R.

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Long-Term Stability Test System for High-Voltage, High-Frequency SiC Power Devices von Duong, Tam H., Berning, David W., Hefner, A. R., Smedley, Keyue M.

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IGBT model validation for soft-switching applications von Berning, D.W., Hefner, A.R.

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IGBT model validation von Berning, D.W., Hefner, A.R.

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Automated Parameter Extraction Software for High-Voltage, High-Frequency SiC Power MOSFETs von Duong, T.H., Hefner, A.R., Berning, D.W.

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Failure dynamics of the IGBT during turn-off for unclamped inductive loading conditions von Chih-Chieh Shen, Kefner, A.R., Berning, D.W., Bernstein, J.B.

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IGBT half-bridge shoot-through characterization for model validation von Berning, D.W., Hefner, A.R.

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Output transformerless amplifier impedance matching apparatus von BERNING, DAVID W

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Audio amplifier von BERNING, DAVID W

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A reverse-bias safe operating area transistor tester / David W. Berning von Berning, David W

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A reverse-bias safe operating area transistor tester / David W. Berning : no.400:54 von Berning, David W

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Laser scanning of MOS IC's reveals internal logic states nondestructively von Sawyer, D.E., Berning, D.W.

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Audio amplifier von BERNING, DAVID W

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Issues in validating package compact thermal models for natural convection cooled electronic systems von Adams, V.H., Blackburn, D.L., Joshi, Y.K., Berning, D.W.

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