An alternative approach to the calculation of four-probe resistances on nonuniform structures von ALBERS, J, BERKOWITZ, H. L

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An Efficient Integration Technique for Use in the Multilayer Analysis of Spreading Resistance Profiles von Berkowitz, H. L., Lux, R. A.

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Drug Interactions von Berkowitz, Howard L.

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Annealing of ion-implanted silicon by an incoherent light pulse von Bomke, H. A., Berkowitz, H. L., Harmatz, M., Kronenberg, S., Lux, R.

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The relation between two-probe and four-probe resistances on nonuniform structures von ALBERS, J, BERKOWITZ, H. L

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Marijuana-induced depersonalizaton von Berkowitz, H L

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The effects of surface charge on spreading resistance profiles measured on p-on-p+ epitaxial si wafers von BERKOWITZ, H. L

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Restless legs syndrome disguised as an affective disorder von BERKOWITZ, H. L

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Modafinil in Poststroke Depression von Berkowitz, Howard L.

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Argyll-Robertson Pupil and Neurosyphilis von Berkowitz, Howard L.

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Another Approach to Hyperpyrexia von BERKOWITZ, HOWARD L

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House officer knowledgeability of organic brain syndromes: A pilot study von Berkowitz, Howard L.

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Optimization of the spreading resistance profiling technique for submicron structures von Berkowitz, H.L., Burnell, D.M., Hillard, R.J., Mazur, R.G., Rai-Choudhury, P.

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Errors in Resistivities Calculated by Multilayer Analysis of Spreading Resistances von Berkowitz, H. L., Lux, R. A.

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Optimization of the spreding resistance profiling technique for submicron structures: Material and process characterizeation for semiconductor device simulation von BERKOWITZ, H. L, BURNELL, D. M, HILLARD, R. J, MAZUR, R. G, RAI-CHOUDHURY, P

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Another approach to hyperpyrexia von Berkowitz, H L

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A Proximity effect Correction Program for Electron Beam Lithography von Berkowitz,H L, Lux,R A

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An Efficient Integration Technique for Use in the Multilayer Analysis of Spreading Resistance Profiles von Berkowitz, H L, Lux, R A

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Annealing of Boron-Implanted Silicon by a Heat-Assisted Noncoherent Light Flash von Bomke,H A, Berkowitz,H L, Harmatz,M, Kronenberg,S, Lux,R

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Profiling of compound semiconductors using point contact techniques von Hillard, R.J., Berkowitz, H.L., Heddleson, J.M., Mazur, R.G., Rai-Choudhury, P.

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