Structural, chemical, and magnetic properties of cobalt intercalated graphene on silicon carbide von Hönig, R, Roese, P, Shamout, K, Ohkochi, T, Berges, U, Westphal, C

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Structural, chemical, and magnetic investigation of a graphene/cobalt/platinum multilayer system on silicon carbide von Weinert, P, Hochhaus, J, Kesper, L, Appel, R, Hilgers, S, Schmitz, M, Schulte, M, Hönig, R, Kronast, F, Valencia, S, Kruskopf, M, Chatterjee, A, Berges, U, Westphal, C

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X-ray magneto-optical polarization spectroscopy: an analysis from the visible region to the x-ray regime von Tesch, M F, Gilbert, M C, Mertins, H-Ch, Bürgler, D E, Berges, U, Schneider, C M

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A detailed look beneath the surface: Evidence of a surface reconstruction beneath a capping layer von Krull, D., Tesch, M.F., Schönbohm, F., Lühr, T., Keutner, C., Berges, U., Mertins, H.-Ch, Westphal, C.

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Thermal stability of an ultrathin hafnium oxide film on plasma nitrided Si(100) von Skaja, K., Schönbohm, F., Weier, D., Lühr, T., Keutner, C., Berges, U., Westphal, C.

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Hard x-ray photoemission spectroscopy on the trilayer system MgO/Au/Fe using standing-wave excitation von Döring, S, Schönbohm, F, Berges, U, Bürgler, D E, Schneider, C M, Gorgoi, M, Schäfers, F, Westphal, C

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The local adsorption of pyridine on Si(100) a combined PES and XPD study von Weier, D., Lühr, T., Beimborn, A., Schönbohm, F., Döring, S., Berges, U., Westphal, C.

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Photoelectron spectroscopy (PES) and photoelectron diffraction (XPD) studies on the local adsorption of cyclopentene on Si(100) von Weier, D., Lühr, T., Beimborn, A., Schönbohm, F., Döring, S., Berges, U., Westphal, C.

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Determination of the source of two extra components in Si 2p photoelectron spectra of the SiO2/Si(1 0 0 ) interface von Dreiner, S, Schurmann, M, Krause, M, Berges, U, Westphal, C

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Evolution of chemical states within the HfO2/Si(100) interface upon annealing, prepared by direct electron beam evaporation von FLÜCHTER, C. R, WEIER, D, SCHÜRMANN, M, BERGES, U, DÖRING, S, WESTPHAL, C

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PGM-Beamline at the Undulator U55 at DELTA von Berges, U, Doring, S, Westphal, C

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TGM-Beamline at DELTA von Berges, U, Doring, S, Westphal, C

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Structural and electronic analysis of Hf on Si(1 1 1) surface studied by XPS, LEED and XPD von Carazzolle, M.F., Schürmann, M., Flüchter, C.R., Weier, D., Berges, U., de Siervo, A., Landers, R., Kleiman, G.G., Westphal, C.

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Experimental Endstation of Beamline BL9 at DELTA von Krywka, C, Sternemann, C, Paulus, M, Volmer, M, Berges, U, Tolan, M

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Status of the Synchrotron Light Source DELTA von Berges, U, Sternemann, C, Tolan, M, Westphal, C, Weis, T, Wille, K

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The plane-grating monochromator beamline at the U55 undulator for surface and interface studies at DELTA von Westphal, C., Berges, U., Dreiner, S., Follath, R., Krause, M., Schäfers, F., Schirmer, D., Schürmann, M.

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The DELTA Synchrotron Light Interferometer von Berges, U

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Structure analysis of the system Hafnium/Silicon ( 1 0 0 ) by means of X-ray photoelectron spectroscopy and X-ray photoelectron diffraction (XPD) von Flüchter, C.R., de Siervo, A., Weier, D., Schürmann, M., Berges, U., Dreiner, S., Carazzolle, M.F., Landers, R., Kleiman, G.G., Westphal, C.

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Der Zorn Gottes in der Prophetie und Poesie Israels auf dem Hintergrund altorientalischer Vorstellungen von BERGES, U

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Photoelectron spectroscopy (XPS) and photoelectron diffraction (XPD) studies on the system hafnium silicide and hafnium oxide on Si(1 0 0) von Weier, D., Flüchter, C., de Siervo, A., Schürmann, M., Dreiner, S., Berges, U., Carazzolle, M.F., Pancotti, A., Landers, R., Kleiman, G.G., Westphal, C.

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