Obtaining high defect coverage for frequency-dependent defects in complex ASICs von Madge, R., Benware, B.R., Daasch, W.R.

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Determination of XUV optical constants by reflectometry using a high-repetition rate 46.9-nm laser von Artioukov, I.A., Benware, B.R., Rocca, J.J., Forsythe, M., Uspenskii, Yu.A., Vinogradov, A.V.

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Effectiveness comparisons of outlier screening methods for frequency dependent defects on complex ASICs von Benware, B.R., Madge, R., Lu, C., Daasch, R.

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Achieving sub 100 DPPM defect levels on VDSM and nanometer ASICs von Benware, B.R.

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Demonstration of a 1 mW average power, 7 Hz table-top soft X-ray laser von Benware, B.R., Macchietto, C.D., Moreno, C.H., Rocca, J.J.

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Generation of millijoule-level soft X-ray laser pulses at 4 Hz repetition rate in a highly saturated table-top capillary discharge amplifier von Rocca, J.J., Benware, B.R., Macchietto, C.D., Shlyaptsev, V.N.

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Table-Top Discharge Pumped Soft X-Ray Lasers von Rocca, J.J., Moreno, C.H., Benware, B.R., Marconi, M.C., Shlyaptsev, V.N., Gonzalez, J.J., Fratti, M., Tomasel, F., Chilla, J.L.A.

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