Dependences of titanium silicide properties on the ratio of silicon to titanium used for electron-beam coevaporation onto heated substrates von Nam, H.G., Chung, I., Bene, R.W.

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The effect of interfaces on electronic switching in VO2 thin films von Remke, R.L., Walser, R.M., Bené, R.W.

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Transition layers between VO2 films and oxide substrates von Remke, R.L., Walser, R.M., Bené, R.W.

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Radiation detection with the pyromagnetic effect von Walser, R.M., Bene, R.W., Caruthers, R.E.

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The effect of interfaces on electronic switching in VO 2 thin films von Remke, R.L., Walser, R.M., Bené, R.W.

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“1/f” noise in thin metal films interacting with silicon substrates von Bené, R.W., Lee, G.S., Cho, N.I.

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Transition layers between VO 2 films and oxide substrates von Remke, R.L., Walser, R.M., Bené, R.W.

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