A Compact Ion Accelerator for Ion-Beam Technologies von Belykh, S. F., Bekkerman, A. D., Boguslavskii, D. A., Tolstoguzov, A. B.

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TOF-SIMS for carbon hybridization state analysis von Drozdov, M.N., Ieshkin, A.E., Streletskiy, O.A., Nishchak, O. Yu, Belykh, S.F., Tolstoguzov, A.

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Method of Direct Detection and Investigation of Long-Lived Excited States of Singly and Multiply Charged Ions of Transition and Rare-Earth Metals von Belykh, S. F., Tolstoguzov, A. B., Bekkerman, A. D., Bogdanova, T. V.

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Influence of the Finite-Size Effect on the Cluster Ion Emission of Silicon Nanostructures von Tolstoguzov, A. B., Drozdov, M. N., Ieshkin, A. E., Tatarintsev, A. A., Myakon’kikh, A. V., Belykh, S. F., Korobeishchikov, N. G., Pelenovich, V. O., Fu, D. J.

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Quantitative depth profiling of Si1–xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry von Drozdov, M.N., Drozdov, Y.N., Csik, A., Novikov, A.V., Vad, K., Yunin, P.A., Yurasov, D.V., Belykh, S.F., Gololobov, G.P., Suvorov, D.V., Tolstogouzov, A.

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Ion-Beam Sources Based on Solid Electrolytes for Aerospace Applications and Ion-Beam Technologies (Review) von Tolstoguzov, A. B., Belykh, S. F., Gololobov, G. P., Gurov, V. S., Gusev, S. I., Suvorov, D. V., Taganov, A. I., Fud, D. J., Ai, Z., Liu, C. S.

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Features of spectra of low-energy neon ions scattered from gallium phosphide von Tolstoguzov, A. B., Belykh, S. F., Gololobov, G. P., Suvorov, D. V.

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Principles of the Construction and Computer Simulation of a Source of Homogeneous and Heterogeneous Cluster Ions von Belykh, S. F., Bekkerman, A. D., Tolstogouzov, A. B., Lozovan, A. A., Fu, D. J.

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Effect of the electronic subsystem excitation on the ionisation probability of atoms sputtered from metals by atomic and molecular projectiles von Belykh, S.F., Wojciechowski, I.A., Palitsin, V.V., Zinoviev, A.V., Adriaens, A., Adams, F.

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Sputtering of silicon by atomic and cluster bismuth ions: An influence of projectile nuclearity and specific kinetic energy on the sputter yield von Tolstogouzov, A., Mazarov, P., Ieshkin, A.E., Belykh, S.F., Korobeishchikov, N.G., Pelenovich, V.O., Fu, D.J.

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New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications von Belykh, S. F., Palitsin, V. V., Veryovkin, I. V., Kovarsky, A. P., Chang, R. J. H., Adriaens, A., Dowsett, M. G., Adams, F.

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Caesium sputter ion source compatible with commercial SIMS instruments von Belykh, S.F., Palitsin, V.V., Veryovkin, I.V., Kovarsky, A.P., Chang, R.J.H., Adriaens, A., Dowsett, M., Adams, F.

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Energy spectra of ions and the energy dependence of the degree of ionization of atoms emitted from metals in a nonlinear sputtering mode von Belykh, S. F., Tolstoguzov, A. B., Lozovan, A. A.

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On the trends in kinetic energies of secondary ions produced by polyatomic ion bombardment von Veryovkin, Igor V., Belykh, Sergey F., Adriaens, Annemie, Zinovev, Alexander V., Adams, Freddy

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Sputtering with polyatomic ions: revisiting kinetic energy distributions of secondary ions von Veryovkin, I.V., Belykh, S.F., Adriaens, A., Adams, F.

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Relative yields, mass distributions and energy spectra of cluster ions sputtered from niobium under keV atomic and polyatomic gold ion bombardment von Belykh, S.F, Habets, B, Rasulev, U.Kh, Samartsev, A.V, Stroev, L.V, Veryovkin, I.V

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Non-additivity of multiply charged ion emission from Si and Al produced by molecular projectiles von Belykh, S.F, Palitsin, V.V, Adriaens, A, Adams, F

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Temperature dependence of secondary ion emission from tantalum produced by atomic and polyatomic gold projectiles von Belykh, S.F., Veryovkin, I.V., Palitsin, V.V., Samartsev, A.V., Adriaens, A., Adams, F.

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Model for the emission of quasi-thermal atoms during sputtering of metals in the nonlinear collision cascade regime von Belykh, S. F., Tolstoguzov, A. B., Lozovan, A. A., Aleshin, M. E., Elant’ev, I. A.

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Non-additive sputtering of niobium and tantalum as neutral and charged clusters von Belykh, S.F, Palitsin, V.V, Veryovkin, I.V, Adriaens, A, Adams, F

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