On the Construction of 3D Fibonacci Spirals von Nagy, Mariana, Cowell, Simon R., Beiu, Valeriu

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The Roots of the Reliability Polynomials of Circular Consecutive-k-out-of-n:F Systems von Jianu, Marilena, Dăuş, Leonard, Drăgoi, Vlad-Florin, Beiu, Valeriu

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On a Surface Associated with Pascal’s Triangle von Beiu, Valeriu, Dăuş, Leonard, Jianu, Marilena, Mihai, Adela, Mihai, Ion

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On the Exact Reliability Enhancements of Small Hammock Networks von Cowell, Simon R., Beiu, Valeriu, Daus, Leonard, Poulin, Philippe

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On the Reliability of Majority Gates Full Adders von Ibrahim, W., Beiu, V., Sulieman, M.H.

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Which Coefficients Matter Most-Consecutive k-Out-of- n: F Systems Revisited von Dragoi, Vlad-Florin, Beiu, Valeriu

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Studying the Binary Erasure Polarization Subchannels Using Network Reliability von Dragoi, Vlad, Beiu, Valeriu

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Lower and Upper Reliability Bounds for Consecutive- k -Out-of- n : Systems von Daus, Leonard, Beiu, Valeriu

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Fiber optic mechanical deformation sensors employing perpendicular photonic crystals von Beiu, Roxana-Mariana, Beiu, Valeriu, Duma, Virgil-Florin

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Serial Addition: Locally Connected Architectures von Beiu, V., Aunet, S., Nyathi, J., Rydberg, R.R., Ibrahim, W.

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Fast reliability ranking of matchstick minimal networks von Drǎgoi, Vlad‐Florin, Beiu, Valeriu

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The Roots of the Reliability Polynomials of Circular Consecutive-Ik/I-out-of-In/I:F Systems von Jianu, Marilena, Daus, Leonard, Dragoi, Vlad-Florin, Beiu, Valeriu

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Reliability polynomials of consecutive‐k‐out‐of‐n:F systems have unbounded roots von Jianu, Marilena, Dăuş, Leonard, Drăgoi, Vlad‐Florin, Beiu, Valeriu

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Four Input Sorter Good, Larger Ones Not So Good von Dragoi, Vlad-Florin, Cowell, Simon, Beiu, Valeriu

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Survey of Cubic Fibonacci Identities When Cuboids Carry Weight von Nagy, Mariana, Cowell, Simon Robin, Beiu, Valeriu

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Using Bayesian Networks to Accurately Calculate the Reliability of Complementary Metal Oxide Semiconductor Gates von Ibrahim, W., Beiu, V.

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VLSI implementations of threshold logic-a comprehensive survey von Beiu, V., Quintana, J.M., Avedillo, M.J.

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Reliability bounds for two dimensional consecutive systems von Beiu, Valeriu, Dăuş, Leonard

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Two-Terminal Reliability of the K4-Ladder—Revisited von Poulin, Philippe, Cowell, Simon R., Beiu, Valeriu

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Reliability and performance of optimised Schmitt trigger gates von Tache, Mihai, Ibrahim, Walid, Kharbash, Fekri, Beiu, Valeriu

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