Accelerator-based radiation sources for next-generation radiobiological research von DeVeaux, Linda C., Wells, Douglas P., Hunt, Alan, Webb, Tim, Beezhold, Wendland, Harmon, J.Frank

Volltext

Development and Testing of Gallium Arsenide Photoconductive Detectors for Ultra Fast, High Dose Rate Pulsed Electron and Bremsstrahlung Radiation Measurements von Kharashvili, George, Makarashvili, Vakhtang, Mitchell, Marc, Beezhold, Wendland, Spaulding, Randy, Wells, Douglas, Gesell, Thomas, Wingert, Wayne

Volltext

2006 IEEE Nuclear and Space Radiation Effects Conference Awards Comments by the Chairman

Volltext

Electron paramagnetic resonance of the lattice damage in oxygen-implanted silicon von Brower, K.L., Beezhold, Wendland

Volltext

A review of the 40-year history of the NSREC'S dosimetry and facilities session (1963-2003) von Beezhold, W., Beutler, D.E., Garth, J.C., Griffin, P.J.

Volltext

Electron Paramagnetic Resonance of the Lattice Damage in Boron-Implanted Intrinsic Silicon von Beezhold, Wendland, Brower, K. L.

Volltext

LOCALIZED MODES AND DIVACANCY ABSORPTION IN OXYGEN ION IMPLANTED Si von Stein, H. J., Beezhold, Wendland

Volltext

Effects of ion bombardment on Na and Cl motion in SiO 2 thin films von Beezhold, Wendland

Volltext

Proton-induced characteristic x-ray analysis of Na and Cl impurity atoms in SiO2 thin films von Beezhold, Wendland

Volltext

Effects of ion bombardment on Na and Cl motion in SiO2 thin films von Beezhold, Wendland

Volltext

Study of 3He +-bombarded palladium using nuclear magnetic resonance techniques von Weaver, H.T., Beezhold, Wendland

Volltext

An ultrahigh vacuum system for ion-induced characteristic X-ray analysis von Beezhold, Wendland

Volltext

Crystalline to Amorphous Transformation in Ion-Bombarded Silicon von Beezhold, Wendland

Volltext

Non linear volume expansion in helium implanted erbium metal films von Blewer, R. S., Beezhold, Wendland

Volltext

Determination of the Electric-Field-Gradient Tensor at the Arsenic Site in K H 2 As O 4 by Proton Relaxation Measurements von Beezhold, Wendland, Uehling, Edwin A.

Volltext

Ion implantation into insulators: charge-removal studies using ion-induced characteristic x rays von Beezhold, Wendland, EerNisse, E.P.

Volltext

Observation of nuclear magnetic resonance from ion-implanted atoms von Weaver, H. T., Beezhold, Wendland

Volltext

Generalized Model for Microcircuit Transient Radiation Response Prediction von Beezhold, Wendland, Bowman, William C, Johnston, Allan H

Volltext bestellen