Investigation of the oxidation behaviour of thin film and bulk copper von O'Reilly, M., Jiang, X., Beechinor, J.T., Lynch, S., NíDheasuna, C., Patterson, J.C., Crean, G.M.

Volltext

Optical and structural properties of InGaP heterostructures von MORIARTY, G. R, KILDEMO, M, BEECHINOR, J. T, MURTAGH, M, KELLY, P. V, CREAN, G. M, BLAND, S. W

Volltext

Thin tantalum pentoxide films deposited by photo-induced chemical vapor deposition using an injection liquid source von Zhang, J.-Y., Boyd, I.W., Mooney, M.B., Hurley, P.K., Beechinor, J.T., O’Sullivan, B.J., Kelly, P.V., Crean, G.M., Senateur, J.-P., Jimenez, C., Paillous, M.

Volltext

InGaP/GaAs heterojunction bipolar transistor optical and electronic band structure characterization von MURTAGH, M, BEECHINOR, J. T, CORDERO, N, KELLY, P. V, CREAN, G. M, FARRELL, I. L, O'CONNOR, G. M, BLAND, S. W

Volltext

Investigation of Si/SiGe heterostructure material using non-destructive optical techniques von COONAN, B. P, GRIFFIN, N, D'AVITAYA, F. A, DERRIEN, J, PAUL, D. J, BEECHINOR, J. T, MURTAGH, M, REDMOND, G, CREAN, G. M, HOLLÄNDER, B, MANTL, S, BOZZO, S, LAZZARI, J.-L

Volltext

InGaP/GaAs based heterojunction bipolar transistor characterisation using non-contact optical spectroscopy von Murtagh, M, Beechinor, J.T, Cordero, N, Kelly, P.V, Crean, G.M, Bland, S.W

Volltext

Observation of wavelength-dependent generation efficiency of laser-induced ultrasonic surface acoustic waves on ceramic materials von Flannery, C. M., Kelly, P. V., Beechinor, J. T., Crean, G. M.

Volltext

Optical characterisation of thin film benzocyclobutene (BCB) based polymers von Beechinor, J.T., McGlynn, E., O'Reilly, M., Crean, G.M.

Volltext

Characteristics of tantalum pentoxide dielectric films deposited on silicon by excimer-lamp assisted photo-induced CVD using an injection liquid source von Mooney, M.B., Hurley, P.K., O'Sullivan, B.J., Beechinor, J.T., Zhang, J.-Y., Boyd, I.W., Kelly, P.V., Sénateur, J.-P., Crean, G.M., Jimenez, C., Paillous, M.

Volltext

Electrical Characterization of Defects Introduced During Plasma-Based Processing of GaAs von Goodman, S.A., Deenapanray, Prakash N.K., Masterson, H.J., Auret, F. Danie, Murtagh, M., Myburg, G., Crean, G.M., Meyer, W.E., Beechinor, J.T., Ye, Shu-Ren

Volltext