A laser plasma X-ray source for the analysis of wafer surfaces by grazing emission X-ray fluorescence spectrometry von Schwenke, H., Knoth, J., Beaven, P.A., Kiehn, R., Buhrz, J.

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Wrought magnesium alloys for structural applications von Letzig, D., Swiostek, J., Bohlen, J., Beaven, P. A., Kainer, K. U.

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Applications of total reflection X-ray fluorescence spectrometry in trace element and surface analysis von SCHWENKE, H, BEAVEN, P. A, KNOTH, J

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A tunable focusing monochromator for total reflection x-ray fluorescence spectrometers von Knoth, J., Beaven, P. A., Michaelsen, C., Schneider, H., Schwenke, H.

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Creep behaviour of dual-phase intermetallics based on (Ti, Nb) 3(Al, Si) and (Ti, Nb) 5(Si, Al) 3 von Es-Souni, M, Wagner, R, Beaven, P.A, Bartels, A

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Microstructure and phase relationships in a rapidly solidified dual phase alloy based on Ti3(Al,Si) + Ti5(Si,Al)3 von ES-SOUNI, M, WAGNER, R, BEAVEN, P. A

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Deformation processes related to interfacial boundaries in two-phase γ-titanium aluminides von Appel, F., Beaven, P.A., Wagner, R.

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Microstructure of copper-bearing CMn weld metal: As-welded and stress-relieved states von Es-Souni, M., Beaven, P.A., Evans, G.M.

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Microanalysis of inclusion/matrix interfaces in weld metals von Es-Souni, M., Beaven, P. A.

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Site occupation of Nb, V, Mn and Cr in γ-TiAl von Mohandas, E., Beaven, P.A.

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Carbide precipitation in γ-TiAl alloys von Chen, S., Beaven, P.A., Wagner, R.

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On the relationship between lattice parameters and composition of the γ-TiAl phase von Pfullmann, Th, Beaven, P.A.

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Stoichiometry Effects in TiAl and TiAlCr Alloys von Beaven, P A, Pfullmann, T H

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Carbide precipitation in certain alloys of the Co-Ni-Cr-C system von Beaven, P A, Swann, P R, West, D R F

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Atom probe microanalytical studies of some commercially important steels von Miller, M.K., Beaven, P.A., Lewis, R.J., Smith, G.D.W.

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The role of dislocations in the precipitation of M23C6 in Co-Cr-C alloys von Beaven, P A, Swann, P R, West, D R F

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A study of the early stages of tempering of iron-carbon martensites by atom probe field ion microscopy

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Combined FIM/TEM determination of the structure of an incoherent twin boundary in tungsten von Beaven, P. A., Smith, D. A., Miller, M. K., Smith, G. D. W.

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A wavelength-dispersive arrangement for wafer analysis with total reflection X-ray fluorescence spectrometry using synchrotron radiation von Schwenke, Heinrich, Beaven, Peter A, Knoth, Joachim, Jantzen, Eckard

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A novel gas-filled detector for pulsed X-ray sources von Beaven, Peter A., Marmotti, Mauro, Kampmann, Reinhard, Knoth, Joachim, Schwenke, Heinrich

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