4 π spectrometer of β -decay electrons with Si(Li)-detectors von Alekseev, I.E., Bakhlanov, S.V., Bazlov, N.V., Chmel, E.A., Derbin, A.V., Drachnev, I.S., Kotina, I.M., Mikulich, M.S., Muratova, V.N., Niyazova, N.V., Semonov, D.A., Trushin, M.V., Unzhakov, E.V.

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4π spectrometer of β-decay electrons with Si(Li)-detectors von Alekseev, I.E., Bakhlanov, S.V., Bazlov, N.V., Chmel, E.A., Derbin, A.V., Drachnev, I.S., Kotina, I.M., Mikulich, M.S., Muratova, V.N., Niyazova, N.V., Semonov, D.A., Trushin, M.V., Unzhakov, E.V.

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Beta-spectrometer with Si-detectors for the study of  144Ce–144Pr decays von Alexeev, I.E., Bakhlanov, S.V., Bazlov, N.V., Chmel, E.A., Derbin, A.V., Drachnev, I.S., Kotina, I.M., Muratova, V.N., Pilipenko, N.V., Semyonov, D.A., Unzhakov, E.V., Yeremin, V.K.

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A measurement method of a detector response function for monochromatic electrons based on the Compton scattering von Bakhlanov, S.V., Bazlov, N.V., Derbin, A.V., Drachnev, I.S., Kayunov, A.S., Muratova, V.N., Semenov, D.A., Unzhakov, E.V.

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Charge-controlled fixation of DNA molecules on silicon surface and electro-physical properties of Au–DNA–Si interface von Bazlov, N.V., Vyvenko, O.F., Sokolov, P.A., Kas’yanenko, N.A., Petrov, Yu V.

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Impact of Hydrogenation on Electrical Properties of NiSi2 Precipitates in Silicon von Schröter, Wolfgang, Hahn, George T., Bazlov, N.V., Seibt, Michael, Nadolinski, A.A., Vyvenko, O.F., Trushin, M.V.

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METHOD OF CLEANING METAL SURFACES OF EQUIPMENT AND DEVICE FOR REALIZATION OF THIS METHOD von SHARAPOV V.S, BAZLOV N.V, GUDKOV V.L, BURJAK A.K, UL'JANOV A.V, TARASOV A.L, BIRJUKOV G.P, IGNAT'EV I.JU

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