Measurement and Extraction of Parasitic Parameters of Quasi-Vertical Schottky Diodes at Submillimeter Wavelengths von Nadri, Souheil, Xie, Linli, Jafari, Masoud, Bauwens, Matthew F., Arsenovic, Alexander, Weikle, Robert M.

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160 GHz Balanced Frequency Quadruplers Based on Quasi-Vertical Schottky Varactors Integrated on Micromachined Silicon von Alijabbari, Naser, Bauwens, Matthew F., Weikle, Robert M.

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Improved current filament control during Zener diode zapping von Roig, J., Lebon, J., Vandeweghe, S., Mouhoubi, S., Bauwens, F.

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A Phase Conjugator Based on Fourth-Order Subharmonically Pumped Mixers von Iyer, Vinay, Widmann, Dustin, Moore, Christopher, Bauwens, Matthew F., Bowers, Steven M., Weikle, Robert M.

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A New Method to Improve Tradeoff Performance for Advanced Power MOSFETs von Vershinin, K., Moens, P., Bauwens, F., Narayanan, E.M.S., Tack, M.

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Gate-Oxide Breakage Assisted by HCI in Advanced STI DeMOS Transistors von Cortes, I., Roig, J., Moens, P., Mouhoubi, S., Gassot, P., Rebollo, J., Bauwens, F., Flores, D.

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P-GaN HEMTs Drain and Gate Current Analysis Under Short-Circuit von Fernandez, M., Perpina, X., Roig, J., Vellvehi, M., Bauwens, F., Jorda, X., Tack, M.

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Electronic Calibration for Submillimeter-Wave On-Wafer Scattering Parameter Measurements Using Schottky Diodes von Xie, Linli, Bauwens, Matthew F., Nadri, Souheil, Arsenovic, Alexander, Cyberey, Michael E., Lichtenberger, Arthur W., Barker, Nicholas Scott, Weikle, Robert M.

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Next generation of Deep Trench Isolation for Smart Power technologies with 120 V high-voltage devices von Charavel, R., Roig, J., Mouhoubi, S., Gassot, P., Bauwens, F., Vanmeerbeek, P., Desoete, B., Moens, P., De Backer, E.

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Improved Micromachined Terahertz On-Wafer Probe Using Integrated Strain Sensor von Qiang Yu, Bauwens, Matthew F., Chunhu Zhang, Lichtenberger, Arthur W., Weikle, Robert M., Barker, N. Scott

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Thermal resistance assessment in multi-trenched power devices von Roig, J., Desoete, B., Bauwens, F., Lovadina, F., Moens, P.

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Improved Trench-Based Power Rectifiers for High-Temperature Smart-Power Applications von Roig, J., Jordan, D., Desoete, B., Mouhoubi, S., Rinaldi, A., Bauwens, F., Moens, P., Tack, M.

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Anomalous Bulk Current Effects in Trench-Based Integrated Power Transistors von Moens, P., Roig, J., Desoete, B., Bauwens, F., Tack, M.

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Spatial distribution of interface traps in DeMOS transistors von Moens, P., Vlachakis, B., Bauwens, F., De Schepper, L.

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Detection of pharmaceutical products in untreated hospital wastewater von Gillard, N, Detry, B, Robert, C, Nonet, S, Samou, Y, Moise, E, Bauwens, F, Delahaut, P

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A 0-40 GHz On-Wafer Probe With Replaceable Micromachined Silicon Tip von Gonzalez, Benjamin D., Bauwens, Matthew F., Zhang, Chunhu, Lichtenberger, Arthur W., Barker, N. Scott, Weikle, Robert M.

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Locating hot carrier injection in n-type DeMOS transistors by Charge Pumping and 2D device simulations von BAUWENS, F, MOENS, P

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A family of robust DMOS devices for automotive applications von Mouhoubi, S., Wu, Y., Bauwens, F., Roig, J., Gassot, P., Tack, M.

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Influence of arterial blood pressure and aldosterone on left ventricular hypertrophy in moderate essential hypertension von Duprez, Daniel A., Bauwens, Frank R., De Buyzere, Marc L., De Backer, Tine L., Kaufman, Jean M., Van Hoecke, José, Vermeulen, Alex, Clement, Denis L.

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Electron trapping and interface trap generation in drain extended PMOS transistors von Moens, P., Bauwens, F., Nelson, M., Tack, M.

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