Selective excitation and photoinduced bleaching of defects in InAlGaAs/GaAs high-power diode lasers von Tomm, J. W., Bärwolff, A., Elsaesser, T., Luft, J.

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Transient thermal behavior of high power diode laser arrays von Puchert, R., Barwolff, A., Voss, M., Menzel, U., Tomm, J.W., Luft, J.

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Direct spectroscopic measurement of mounting-induced strain in high-power optoelectronic devices von Tomm, J. W., Müller, R., Bärwolff, A., Elsaesser, T., Lorenzen, D., Daiminger, F. X., Gerhardt, A., Donecker, J.

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Aging properties of high power laser diode arrays analyzed by Fourier-transform photocurrent measurements von Tomm, J. W., Jaeger, A., Bärwolff, A., Elsaesser, T., Gerhardt, A., Donecker, J.

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Facet degradation of high-power diode laser arrays von TOMM, J. W, THAMM, E, BÄRWOLFF, A, ELSAESSER, T, LUFT, J, BAEUMLER, M, MUELLER, S, JANTZ, W, RECHENBERG, I, ERBERT, G

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Time-resolved emission studies of GaAs/AlGaAs laser diode arrays on different heat sinks von Voss, M., Lier, C., Menzel, U., Bärwolff, A., Elsaesser, T.

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Measurement of mounting-induced strain and defects in high-power laser diodes using Fourier-transform photo-current spectroscopy von Gerhardt, A, Tomm, J.W, Müller, R, Bärwolff, A, Lorenzen, D, Donecker, J

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Emitter failure and thermal facet load in high-power laser diode arrays von PUCHERT, R, TOMM, J. W, JAEGER, A, BÄRWOLFF, A, LUFT, J, SPÄTH, W

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Minority-carrier kinetics in heavily doped GaAs:C studied by transient photoluminescence von Maaßdorf, A., Gramlich, S., Richter, E., Brunner, F., Weyers, M., Tränkle, G., Tomm, J. W., Mazur, Y. I., Nickel, D., Malyarchuk, V., Günther, T., Lienau, Ch, Bärwolff, A., Elsaesser, T.

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Modelling the temperature dependence of threshold current, external differential efficiency and lasing wavelength in QW laser diodes von Menzel, U, Barwolff, A, Enders, P, Ackermann, D, Puchert, R, Voss, M

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Spectroscopic measurement of packaging-induced strains in quantum-well laser diodes von Tomm, J. W., Müller, R., Bärwolff, A., Elsaesser, T., Gerhardt, A., Donecker, J., Lorenzen, D., Daiminger, F. X., Weiß, S., Hutter, M., Kaulfersch, E., Reichl, H.

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Deep level spectroscopy of high-power laser diode arrays von Tomm, J. W., Bärwolff, A., Jaeger, A., Elsaesser, T., Bollmann, J., Masselink, W. T., Gerhardt, A., Donecker, J.

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Facet heating and axial temperature profiles in high-power GaAlAs/GaAs laser diodes von Menzel, U., Puchert, R., Bärwolff, A., Lau, A.

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Facet and bulk heating of GaAs/AlGaAs high-power laser arrays studied in spatially resolved emission and micro-Raman experiments von Puchert, R., Bärwolff, A., Menzel, U., Lau, A., Voss, M., Elsaesser, T.

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Gigahertz switching behavior of polarization-bistable InGaAsP/InP lasers under high-frequency current modulation von Klehr, A., Müller, R, Voss, M., Bärwolff, A.

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Monitoring of aging properties of AlGaAs high-power laser arrays von Tomm, J. W., Bärwolff, A., Menzel, U., Voss, M., Puchert, R., Elsaesser, Th, Daiminger, F. X., Heinemann, S., Luft, J.

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Non-invasive optical assessment of packaging-induced defects in high-power laser diodes von Barwolff, A., Tomm, J.W.

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Facet heating in high power GaAlAs/GaAs edge emitting laser diodes von Menzel, U., Puchert, R., Barwolff, A., Lau, A.

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Spectroscopic measurement of mounting-induced strain in optoelectronic devices von Barwolff, A., Tomm, J.W., Muller, R., Weiss, S., Hutter, M., Reichl, H.

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Influence of the mounting configuration on the transient thermal behavior of high power laser diode arrays von Puchert, R., Barwolff, A., Voss, M., Menzei, U., Tomm, J.W., Luft, J.

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