Tip-sample characterization in the AFM study of a rod-shaped nanostructure von Picotto, Gian Bartolo, Vallino, Marta, Ribotta, Luigi

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Traceable size determination of nanoparticles, a comparison among European metrology institutes von Meli, Felix, Klein, Tobias, Buhr, Egbert, Frase, Carl Georg, Gleber, Gudrun, Krumrey, Michael, Duta, Alexandru, Duta, Steluta, Korpelainen, Virpi, Bellotti, Roberto, Picotto, Gian Bartolo, Boyd, Robert D, Cuenat, Alexandre

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Comparison of the performance of the next generation of optical interferometers von Pisani, Marco, Yacoot, Andrew, Balling, Petr, Bancone, Nicola, Birlikseven, Cengiz, Çelik, Mehmet, Flügge, Jens, Hamid, Ramiz, Köchert, Paul, Kren, Petr, Kuetgens, Ulrich, Lassila, Antti, Picotto, Gian Bartolo, ahin, Ersoy, Seppä, Jeremias, Tedaldi, Matthew, Weichert, Christoph

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Calibration of 1-D CMM artefacts: step gauges (EURAMET.L-K5.2016) von Coveney, Tim, Matus, Michael, Wang, Shihua, Byman, Ville, Lassila, Antti, Alqahtani, Nasser, Alqahtani, Faisal, Sumner, Dean, Spiller, Jürg, Meli, Felix, Picotto, Gian Bartolo, Bellotti, Roberto, Sato, Osamu, Sharma, Rina, Moona, Girija, Kumar, Vinod, Rodríguez, Joaquín, Prieto, Emilio, Meral, İlker, Ganioğlu, Okhan, Salgado, José, Wójtowicz, Adam, Skalník, Pavel, Zelený, Vít, Stoup, John, Kotte, Gerard, Koops, Richard, Arizmendi, Edgar, Wang, Weinong, Jakobsson, Agneta, Duta, Alexandru, Dugheanu, Elena, Reain, Greg, Szikszai, Gábor

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Differential readings of capacitance-based controls of attitude and displacements at the micro/nano scale von Picotto, Gian Bartolo, Bellotti, Roberto, Sosso, Andrea

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AFM Measurements and Tip Characterization of Nanoparticles with Different Shapes von Bellotti, Roberto, Picotto, Gian Bartolo, Ribotta, Luigi

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Final report on EURAMET.L-S21: `Supplementary comparison of parallel thread gauges von Mudronja, Vedran, Šimunovic, Vedran, Acko, Bojan, Matus, Michael, Bánréti, Edit, István, Dicso, Thalmann, Rudolf, Lassila, Antti, Lillepea, Lauri, Bartolo Picotto, Gian, Bellotti, Roberto, Pometto, Marco, Ganioglu, Okhan, Meral, Ilker, Antonio Salgado, José, Georges, Vailleau

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Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy von Maurino, Valter, Pellegrino, Francesco, Picotto, Gian Bartolo, Ribotta, Luigi

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Measurement of short gauge blocks by interferometry von Prieto, Emilio, Rodriguez, Joaquin, Bartl, Guido, Pirée, Hugo, Meli, Felix, Picotto, Gian Bartolo, Franco, Mauro, Balling, Petr

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Quantitative three-dimensional characterization of critical sizes of non-spherical TiO 2 nanoparticles by using atomic force microscopy von Maurino, Valter, Pellegrino, Francesco, Picotto, Gian Bartolo, Ribotta, Luigi

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Measurement of groove depth standards in the range 1μm up to 1mm (EURAMET project 1407) von Brand, Uwe, Matus, Michael, Carcedo, Laura, Slusarski, Lukasz, Gian Bartolo Picotto, Lassila, Antti, Hungwe, Faith, Flys, Olena, Aksulu, Murat, Kosteev, Vladimir

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Measurement of groove depth standards in the range 1 μm up to 1 mm (EURAMET project 1407) von Brand, Uwe, Matus, Michael, Carcedo, Laura, Slusarski, Lukasz, Picotto, Gian Bartolo, Lassila, Antti, Hungwe, Faith, Flys, Olena, Aksulu, Murat, Kosteev, Vladimir

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Final report on EUROMET.L-K4: Calibration of diameter standards, Group 1 von Picotto, Gian Bartolo

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Optical measurements of morphology-to-functional parameters on electrical contacts of photovoltaic cells von Bellotti, Roberto, Furin, Valentina, Marsura, Alessandro, Picotto, Gian Bartolo, Ribotta, Luigi

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A function-driven characterization of printed conductors on PV cells von Bellotti, Roberto, Furin, Valentina, Maras, Claire, Picotto, Gian Bartolo, Ribotta, Luigi

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Calibration of diameter standards (EURAMET.L-K4.2015) von Picotto, G B, Aksulu, M, Alqahtani, F, Alqahtani, N, Arce, A A, Äremann, M, Astrua, M, Bajić, G, Bandis, C, Baršić, G, Bellelli, D, Bellotti, R, Bozovic, T, Borst, D de, Duchoň, V, Gastaldi, B, Hanrahan, R, Jusko, O, Karanfilovic, M, Katić, M, Koops, R, Kotte, G, Lassila, A, Matus, M, Meli, F, Meral, I, Milne, R, Muñoz, R, Pometto, M, Prieto, E, Salgado, J, Šimunović, V, Spiller, J, Szikszai, G, Szumski, R, Stelmaszczuk, A, Teodorescu, D, Thalmann, R, Toftegaard, J B, Trösch, M

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A multi-electrode plane capacitive sensor for displacement measurements and attitude controls von Picotto, Gian Bartolo, Pisani, Marco, Sosso, Andrea

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Final report on EUROMET.L-K4: Calibration of diameter standards, Group 1 von Picotto, Gian Bartolo

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Calibration of surface roughness standards von Salgado, Duta, Alexandru, Lewis, Andrew, Gunn, Dave, Picotto, Gian Bartolo, Borovsky, Jiri, Nanits, Mats-Maidu, Mudronja, Vedran, Castellanos, Carlos Colin, Kornbilt, Fernando, Renegar, Brian, Souza, Marcos Motta de

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A method for linearization of a laser interferometer down to the picometre level with a capacitive sensor von Seppä, Jeremias, Korpelainen, Virpi, Merimaa, Mikko, Picotto, Gian Bartolo, Lassila, Antti

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